Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for testing periodic running time of hardware board card

A technology of cycle operation and test method, applied in the field of electricity, can solve the problem of inaccurate cycle operation time

Active Publication Date: 2012-06-06
CHINA TECHENERGY +1
View PDF4 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, there are generally time control schemes in the embedded board software of the nuclear power plant control system. These control schemes generally obtain the cycle running time of the board by reading the count value of the counter (timer), so as to determine the current board time. Whether the periodic operation of the card is standard, but since the periodic operation time standard of each board is the same clock source, and the clock source referenced by these control schemes is also the clock source used by each board, in this case, if the clock sources inherently have errors, the measured cycle runtimes of these control schemes are also inaccurate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for testing periodic running time of hardware board card
  • Method for testing periodic running time of hardware board card
  • Method for testing periodic running time of hardware board card

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0025] Connect the measurement probe of the high-precision oscilloscope to the TP point of the test board, insert the execution code at the beginning of the cycle running program of the test board, and the execution code will output 5V high level and 5V low level in sequence during the cycle, After the periodic running program is executed, the 90% conversion level is established based on the high level from low to high, which is 5*90%=4.5V, so the reading point of the high level is as follows Figure 4 in t1. Based on the high level from high to low, the 90% conversion level is established as 5-(5*90%)=0.5V, so the reading point at the end of the high level is as follows Figure 4 in t2. Low-level reading point: 90% conversion level is established based on low level from high to low, which is 5-(5*90%)=0.5V, so the low-level start reading point is as follows Figure 4 in t2. Based on the low level from low to high, the 90% conversion level is established as 5*90%=4.5V, so t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for testing a periodic running time of a hardware board card, which relates to the optical field, and comprises the following steps that: step 1: a signal line of a high-precision oscillograph after the time check is connected onto a test point (TP) of a test board card; step 2: a test code is inserted into a periodic running program of the test board card; step 3: a periodic running time of the periodic running program is determined according to a waveform of the test code displayed on the high-precision oscillograph; and step 4: the periodic running time obtained by the high-precision oscillograph is compared with a designed periodic running time to obtain an error value between the real periodic running time of the periodic running program of the testedboard card and the designed periodic running time. The high-precision oscillograph is used for testing the periodic running time of the board card, so a clock source which is used for the test is independent from a clock source of the board card, the problem of the inaccurate test periodic running time caused by the inaccuracy of a system clock can be avoided, and the time consistence of the entire device can be guaranteed.

Description

technical field [0001] The invention relates to the field of electricity, in particular to a method for accurately testing the cycle running time of a board. Background technique [0002] The nuclear power plant control system has strict requirements on the response time and cycle running time of the system. For each embedded board that makes up the control system, its cycle running time directly affects the response time and cycle running time of the system. Accurately measuring the cycle running time of each embedded board plays an important role in evaluating the response time and cycle running time of the whole system. [0003] At present, there are generally time control schemes in the embedded board software of the nuclear power plant control system. These control schemes generally obtain the cycle running time of the board by reading the count value of the counter (timer), so as to determine the current board time. Whether the periodic operation of the card is standa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G04F10/00
Inventor 黄太新钱升华
Owner CHINA TECHENERGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products