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Method for prolonging irradiation-test interval time in total dose test

A technology of testing intervals and irradiation, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of inconvenient measurement, achieve the effect of improving accuracy, enhancing operability, and scientific test results

Active Publication Date: 2013-08-21
BEIJING SHENGTAOPING TEST ENG TECH RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a method for prolonging the interval between irradiation and testing in the total dose test, so as to solve the problem of inconvenient post-irradiation testing on a large scale

Method used

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Comparison scheme
Effect test

Embodiment 1

[0028] The present invention prolongs the method for irradiation and test interval time in total dose test, comprises the following steps:

[0029] 1) Prolong the time interval from the end of irradiation to the electrical test

[0030] Within half an hour after the end of the irradiation, the irradiated test sample field programmable gate array FPGA (activation energy is 1) was refrigerated in dry ice at -60°C (2 hours). During the refrigerated period, all pins of the sample were short Connect; Half an hour before the electrical test, take out the test sample from the dry ice, let the test sample return to room temperature, and then start the test;

[0031] Using the dry ice refrigeration method, the power consumption current of the FPGA after irradiation was measured to be 0.5mA, and the power consumption current of the FPGA was measured to be 0.046mA after the dry ice refrigeration method was not used. The results of the two tests proved that the dry ice refrigeration metho...

Embodiment 2

[0036] The present invention prolongs the method for irradiation and test interval time in total dose test, comprises the following steps:

[0037] 1) Prolong the time interval from the end of irradiation to the electrical test

[0038] Within half an hour after the end of the irradiation, the irradiated test sample digital signal processor DSP (activation energy ΔE is 0.61) was refrigerated in dry ice at -60°C (36 hours). During the refrigerating period, all pins of the sample were short Connect; Half an hour before the electrical test, take out the test sample from the dry ice, let the test sample return to room temperature, and then start the test;

[0039] Using the dry ice refrigeration method, the power consumption current measured after DSP irradiation was 0.93mA, and the power consumption current measured after DSP irradiation was 0.027mA without using the dry ice refrigeration method. The results of the two tests proved that the dry ice refrigeration method effectivel...

Embodiment 3

[0044] The present invention prolongs the method for irradiation and test interval time in total dose test, comprises the following steps:

[0045] 1) Prolong the time interval from the end of irradiation to the electrical test

[0046] Within half an hour after the end of the irradiation, the irradiated test sample SRAM (activation energy ΔE is 0.65) was refrigerated in dry ice at -60°C (70 hours). During the refrigerated period, all pins of the sample were short-circuited ;Half an hour before the electrical test, take out the test sample from the dry ice, let the test sample return to room temperature, and then start the test;

[0047] Using the dry ice refrigeration method, the power consumption current of the SRAM after irradiation is 0.46mA. Without the dry ice refrigeration method, the power consumption current of the SRAM after the irradiation is 0.0086mA. The results of the two tests prove that the dry ice refrigeration method effectively prevents Annealing effects on...

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Abstract

The invention relates to a method for prolonging irradiation-test interval time in a total dose test. The method comprises: storing a test sample with dry ice (minus 60 DEG C). The method can be used for increasing the irradiation-test interval time from 1 hour to 72 hours and increasing the interval of two irradiation time periods from 2 hours to 144 hours, can be used for improving the operability of the existing irradiation test method standards, and can be used for improving the accuracy of the irradiation test results to make the test results more scientific.

Description

technical field [0001] The invention relates to the field of radiation effect testing and evaluation, in particular to a method for prolonging the interval between irradiation and testing in a total dose test. Background technique [0002] Satellite fault analysis and positioning shows that satellite components are susceptible to the total dose effect induced by the space radiation environment during power-on in orbit, resulting in device electrical performance drift, or even loss of function, which seriously threatens the high reliability of satellites. Ground simulation radiation tests are carried out , to scientifically evaluate the anti-total dose capability of the tested devices, and provide test data for engineering selection of components. Considering the annealing characteristics of the total dose effect, it is generally required that the time interval between the end of irradiation and the electrical test be short. [0003] For example, the current standard GJB548 ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 王群勇陈冬梅阳辉陈宇宋岩钟征宇吴文章刘燕芳白桦
Owner BEIJING SHENGTAOPING TEST ENG TECH RES INST
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