Phase diaphragm capable of measuring optical nonlinearity of material

Abstract

The invention discloses a phase diaphragm (2) capable of measuring optical nonlinearity of material, comprising a phase object (13), wherein the phase delay between the phase object (13) and the phase diaphragm (2) is Pi / 2; the phase object (13) is a symmetrical square. The invention can effectively measure and distinguish the size and symbol of the third-order nonlinear refraction coefficient of a medium without influencing the measuring sensitivity.

Description

technical field [0001] The invention relates to a phase aperture capable of measuring material optical nonlinearity. Background technique [0002] With the rapid development of technologies in the fields of optical communication and optical information processing, research on nonlinear photonic materials is becoming increasingly important. The realization of functions such as optical logic, optical storage, optical transistor, and optical switch mainly depends on the research progress of nonlinear photonics materials. The measurement technology of optical nonlinear parameters of medium is the key technology to study nonlinear optical materials. The 4f phase coherent imaging system (G.Boudebs and S.Cherukulappurath, "Nonlinear optical measurements using a 4f coherent imaging system with phas eobject", Phys.Rev.A, 69, 053813 (1996)) is a measurement proposed in recent years New approaches to nonlinear refraction and absorption in materials. [0003] The 4f phase coherent im...

AI Technical Summary

Problems solved by technology

The sensitivity of the measurement is affected to a certain extent when the phase diaphragm currently used is measured

Images