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Two-box type temperature impact test box

An impact test box and box-type technology, which is applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of box deformation, cumbersome operation, and long-term use failure of travel switches, etc., to achieve exquisite appearance, ensure uniformity, and operate And the effect of stability and humanization

Inactive Publication Date: 2012-01-25
SHANGHAI LINPIN INSTR
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The lifting and lowering of the sample rack is detected by installing a travel switch on the control track of the motor. The disadvantage of the long-term use of the travel switch often occurs, and the cabinet will be deformed when it is serious.
In addition, the lifting time of the sample rack is 5-8 seconds. During this process, there will be temperature interpenetration between the high temperature zone and the low temperature zone, which will cause serious impacts when the temperature changes suddenly.
[0003] The control instruments in the temperature shock box have the disadvantages of cumbersome operation, complicated operation, and low control accuracy, which have brought a lot of inconvenience to customers in terms of test accuracy and use.

Method used

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  • Two-box type temperature impact test box
  • Two-box type temperature impact test box
  • Two-box type temperature impact test box

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Embodiment Construction

[0023] Below in conjunction with accompanying drawing, the present invention will be further described as follows:

[0024] As shown in the accompanying drawings, the present invention includes a high-temperature cabinet 1, a low-temperature cabinet 6, an electrical cabinet 10, an electrical system, a refrigeration system, and a heating system, and a movable partition 5 is provided between the high-temperature cabinet and the low-temperature cabinet. , the front faces of the high temperature box and the low temperature box are respectively connected to the high temperature zone sliding door 15 and the low temperature zone sliding door 13, the high temperature zone sliding door 15 is provided with a high temperature zone observation window 16, and the low temperature zone sliding door 13 is provided with a low temperature Area observation window 14, the inside of the high-temperature box is provided with a heating system, the inside of the low-temperature box is provided with a ...

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Abstract

The invention relates to the technical field of a sample temperature impact test instrument, in particular to a two-box type temperature impact test box, which comprises a high temperature box body, a low temperature box body, an electrical cabinet, an electrical system, a refrigerating system and a heating system, wherein a movable barrier is arranged between the high temperature box body and the low temperature box body, the front end surfaces of the high temperature box body and the low temperature box body are respectively connected with a high temperature area sliding door and a low temperature area sliding door, the heating system is arranged in the high temperature box body, the refrigerating system is arranged in the low temperature box body, the bottom end surface in the low temperature box body is provided with an air cylinder, and a piston end of the air cylinder is connected with a sample rack capable of moving up and down. The two-box type temperature impact test box disclosed by the invention has a novel structure and is convenient to use, the air cylinder is used for pulling the sample rack to carry out high and low temperature tests, the travel switch fault caused by conventional motor pullup and the defect of box body pull deformation are avoided, and the temperatures in the box bodies are uniform and stable.

Description

[technical field] [0001] The invention relates to the technical field of sample temperature shock test instruments, in particular to a two-box temperature shock test chamber. [Background technique] [0002] At present, the common two-box temperature shock test box is divided into high temperature zone and low temperature zone. The switch of the experimental area is by pulling the sample holder from the low temperature area to the high temperature area in the entire box, and then lowering it from the high temperature area to the low temperature area, repeatedly performing high temperature and low temperature shocks. The lifting and lowering of the sample rack is detected by the travel switch installed on the control track of the motor. The disadvantage of the long-term use of the travel switch often occurs, and the cabinet will be deformed in severe cases. In addition, the lifting time of the sample rack is 5-8 seconds. During this process, there will be temperature interpen...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/00
Inventor 孙光林
Owner SHANGHAI LINPIN INSTR
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