Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for measuring object deformation by time-domain multi-wavelength heterodyne speckle interference

A speckle interference and multi-wavelength technology, applied in the field of laser speckle interferometry, can solve problems such as phase ambiguity, limited measurement range, and inability to perform real-time measurement, and achieve the effect of expanding the measurement range

Active Publication Date: 2013-04-24
BEIJING JIAOTONG UNIV
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] From traditional speckle interferometry to electronic speckle interferometry, digital speckle interferometry and other technologies, two problems cannot be avoided: First, the above technologies only record the two states before and after deformation or displacement, and do not involve time parameters , can not be measured in real time; second, in the case of ensuring the measurement accuracy, the measurement range is limited
This method improves the anti-interference ability of the system to a large extent and improves the measurement accuracy of the system, but it still needs to carry out phase unwrapping (Phase Unwrapping), and the problem of phase ambiguity (Phase ambiguity) still exists, so this method is not effective. extended measuring range

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for measuring object deformation by time-domain multi-wavelength heterodyne speckle interference
  • Method for measuring object deformation by time-domain multi-wavelength heterodyne speckle interference
  • Method for measuring object deformation by time-domain multi-wavelength heterodyne speckle interference

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0025] refer to figure 1 , shows a flow chart of a method for measuring deformation of an object by time-domain multi-wavelength heterodyne speckle interferometry according to the present invention, and the method specifically includes:

[0026] Step S101, select two semiconductor lasers with different center wavelengths, the output frequencies are ω 1 and ω 2 linearly polarized light;

[0027] Step S102, after the two beams of linearly polarized light pass through the polarization controller, each beam of light becomes orthogonal linearly polarized light with two frequencies;

[0028] Step S103, two beams of orthogonal linearly polarized light respectively containing two frequencies are spatially filtered and beam expanded through a spatial filter;

[0029] Step S104, the linearly polarized light after the beam expansion is transmitted through the ordinary beam splitter, incident on the polarization beam splitter, and divided into the measurement light and the reference li...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method for measuring object deformation by time-domain multi-wavelength heterodyne speckle interference. The method combines a time-domain speckle interference measurement technology, a heterodyne interference measurement technology and a multi-wavelength measurement technology. Multi-wavelength is introduced for expanding measurement scope; heterodyne is introduced for ensuring measurement precision; and the time-domain technology can directly provide a phase function for a time-varying field. The method has the advantages of simplifying an object deformation detecting system, using two lasers with different central wavelengths, realizing multi-wavelength measurement and expanding the measurement scope.

Description

technical field [0001] The invention relates to the technical field of laser speckle interferometry, in particular to a method for measuring object deformation by time-domain multi-wavelength heterodyne speckle interferometry. Background technique [0002] When the laser is irradiated on an object with a diffuse reflective surface, the high-intensity coherent light diffusely reflected from the surface of the object will interfere to form randomly distributed bright and dark spots, which are named "speckle". Originally, speckle was viewed as a disturbance because it severely affected laser resolution. Therefore, people are trying to reduce the generation of speckle in the use of laser. In the late 1960s, some useful information was found in speckle, and people began to realize that speckle is not only a kind of noise, but also a rare means of random encoding, which can be used to encode and detect the surface. Subsequently, scientists began to study the unique properties of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/16
Inventor 高瞻邓彦韦成段怡婷冯其波
Owner BEIJING JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com