Detecting device for internal structure of jewelry

Abstract

The invention is suitable for a detecting technique for the internal structure of jewelry and particularly provides a non-contact detecting device for the internal structure of the jewelry. The detecting device provided by the invention comprises a light source component, an optical splitter, a reference arm reflector, a photoelectric detector, a signal processing analyzer, a reference arm reflector scanning device and a sample device arm light beam scanning device, wherein the reference arm reflector is fixed on the reference arm reflector scanning device which can make a reciprocating motion; the optical connection exists between the light source component and the input end of the optical splitter, between the two output ends of the optical splitter and the reference arm reflector as well as the jewelry to be measured and between the interference light output end of the optical splitter and the photoelectric detector; and the output end of the photoelectric detector is connected with the electric signal processing analyzer. The detecting device provided by the invention utilizes an optical interference principle to interfere the weak back scattered light and strong reference light of the internal structure of the jewelry, detects the internal structure of the jewelry through detecting interference light signals and greatly improves the detection signal-to-noise ratio and the sensitivity.

Description

technical field [0001] The invention relates to a non-contact jewelry internal structure detection device. Background technique [0002] The detection method for the internal structure of jewelry, especially the internal structure of opaque or translucent jewelry has always been an urgent problem in the field of jewelry detection. The methods for detecting the internal structure of jewelry in the prior art generally include the indirect detection method represented by the comparison method and the X-ray irradiation method, and the direct measurement method represented by the arbitration method. For example, in the detection of the thickness of the pearl layer, according to the national standard GB / T18781-2002 for the classification of cultured pearls, cultured pearls are divided into five grades: extra thick, thick, medium, thin, and extremely thin according to the thickness of the pearl layer. There are three main measurement methods: 1. Comparative method, the principle o...

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Problems solved by technology

[0003] Among the above techniques, method 1 and method 2 belong to indirect measurement, and the accurate value of pearl layer thickness cannot be obtained

The third method is a destructive measurement, and the test sample must be destroyed.

[0004] It can be seen that there is no direct, non-contact measurement method that does not damage jewelry in the prior art

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