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Preprocessing method for measuring content of noble metal ions in high-purity reagent

A precious metal ion, pretreatment column technology, applied in the preparation of test samples, etc., can solve problems such as measurement result error, and achieve the effect of simple and easy operation

Active Publication Date: 2011-09-07
SHANGHAI CHEM REAGENT RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a pretreatment method for measuring the content of noble metal ions in high-purity reagents, so as to overcome the shortcomings of the prior art that use the ignition method to cause large errors in the measurement results

Method used

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  • Preprocessing method for measuring content of noble metal ions in high-purity reagent

Examples

Experimental program
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Effect test

Embodiment 1

[0018] Pass 100g of high-purity acetic acid solution under the condition of 0.05MPa through a pretreatment column with a 0.5μm microporous membrane and immobilized with 5g of polyethylene dithizone laminating resin, remove the microporous membrane, and use 10ml of ethylenediamine hydrogen The sodium oxide solution eluent eluted the precious metal ions enriched on the laminating resin, and the volume was fixed to 25ml with the eluent, and the content of the precious metal ions in the high-purity acetic acid solution was directly sampled. The test results are shown in Table 1.

[0019] Table 1 The original suction method detection result of the present invention is compared with X-ray fluorescence spectrometry detection result

[0020]

Embodiment 2

[0022] Pass 100g of high-purity sulfuric acid solution under the condition of 0.01MPa through a pretreatment column with a 2 μm microporous membrane and solidly loaded with 2.5g of polyethylene dithizone complex membrane resin, remove the microporous membrane, and use 8ml of thiourea-hydrochloric acid The solution eluent elutes the precious metal ions enriched on the laminating resin, and the volume is fixed to 25ml with the eluent, and the content of the noble metal ions in the high-purity sulfuric acid solution is directly sampled. The test results are shown in Table 2 below.

[0023] Table 2 The original suction method detection result of the present invention is compared with X-ray fluorescence spectrometry detection result

[0024]

Embodiment 3

[0026] Pass 100g of high-purity nitric acid solution under the condition of 0.03MPa through a pretreatment column with a 1 μm microporous membrane and solidly loaded with 3.5g of polyethylene dithizone complex membrane resin, remove the microporous membrane, and use 10ml of thiourea-hydrochloric acid The solution eluent elutes the precious metal ions enriched on the laminating resin, and the volume is fixed to 25ml with the eluent, and the content of the noble metal ions in the high-purity nitric acid solution is directly sampled. The test results are shown in Table 3 below.

[0027] Table 3 The original suction method detection result of the present invention is compared with X-ray fluorescence spectrometry detection result

[0028]

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Abstract

The invention discloses a preprocessing method for measuring content of noble metal ions in a high-purity reagent solution. The method comprises the following steps: processing the high-purity reagent solution utilized as a raw material by utilizing a preprocessing column loaded with polyethylene dithizone laminated resin; eluting the enriched noble metal ions by using an eluting agent, and then performing the constant volume process; and using an atomic absorption spectrograph to measure the content of the noble metal ions in the acquired high-purity reagent preprocessed solution, wherein the acquired measured result is consistent with the measured result acquired by using an X fluorescent analysis meter. Compared with the prior art, the method provided by the invention has the advantages that the operation is easy and simple, the noble metal ions in the high-purity reagent are enriched by performing the pressurization ultra-filtration, the post-processing for the acquired preprocessed solution is unnecessary, and the sample can be directly introduced for using the atomic absorption spectrograph to measure the content of noble metal ions in the high purity reagent.

Description

technical field [0001] The invention relates to a pretreatment method for measuring the content of noble metal ions in high-purity reagents, in particular to a pretreatment method for measuring the content of noble metal ions in electronic-grade high-purity reagents by using an atomic absorption spectrometer. Background technique [0002] With the rapid development of the electronics industry, the application of electronic-grade high-purity reagents has become increasingly widespread. The International Semiconductor Equipment and Materials Organization has formulated SEMI standards for chemical materials to regulate the quality of electronic-grade high-purity reagents. The content of noble metal ions in electronic-grade high-purity reagents is required to be controlled far below the conventional detection range, so it is particularly important to reduce the detection limit, improve selectivity and sensitivity, and find a fast and accurate determination of noble metal ions in ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/34
Inventor 宋振曹旭妮
Owner SHANGHAI CHEM REAGENT RES INST
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