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System and method for testing reliability of mass storage system

A mass storage and testing method technology, applied in the field of reliability evaluation system, can solve problems that cannot comprehensively reflect the reliability of mass storage systems, and achieve the effects of promoting development and progress, improving analysis efficiency, and reducing the use of memory space

Inactive Publication Date: 2012-11-21
中国人民解放军装备指挥技术学院
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Problems solved by technology

[0006] For this reason, the technical problem to be solved by the present invention is that the reliability evaluation system in the prior art cannot comprehensively reflect the reliability of the mass storage system, thus a reliability testing system for the mass storage system is proposed

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  • System and method for testing reliability of mass storage system
  • System and method for testing reliability of mass storage system
  • System and method for testing reliability of mass storage system

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specific Embodiment approach

[0051] A reliability testing system for a mass storage system, including a data acquisition unit and a data analysis unit, such as figure 1 shown.

[0052] The data acquisition unit collects data for analysis through testing, including:

[0053] (1) Static test module: summarize the attributes that affect the reliability of the system, determine the check items, formulate the check list, test the check items, and write the test results into the check list;

[0054] (2) 72-hour reliability test module: firstly conduct a factory test, and then conduct a 72-hour stress test to obtain the test results;

[0055] (3) Recovery time test module: Insert a fault in the system under test, measure the performance change of the system under test under fault conditions, and obtain the recovery time;

[0056] (4) BER test module: collect the error rate generated by the disk in the process of reading data;

[0057] (5) MTBF reference data acquisition module: measure the average time betwee...

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Abstract

The invention discloses a system and a method for testing reliability of a mass storage system. The system comprises a data acquisition unit and a data analysis unit, wherein the data acquisition unit comprises a static test module, a 72-hour reliability test module, a recovery time test module, a bit error rate (BER) test module and a mean time between failures (MTBF) reference data acquisition module; the data analysis unit comprises a static test assessment module, a 72-hour reliability test result analysis module, a Markov analysis module, a Monte Carlo analysis module and a mean time to data loss (MTTDL) analysis module; and various performance indexes for reflecting a tested system are acquired by performing data acquisition and data analysis, performing comprehensive test on the aspects of static test, 72-hour reliability test, fault injection-based reliability test and the like and performing analysis by adopting the Markov module, the Monte Carlo module and a disk array MTTDL, so the technical problem that the reliability evaluation system in the prior art cannot comprehensively reflect the reliability of the mass storage system. The system and the method are particularlysuitable for reliability test of the mass storage system.

Description

technical field [0001] The invention relates to a reliability evaluation system of a storage system, in particular to a reliability test and evaluation system of a mass storage system. Background technique [0002] As the technology adopted by modern information systems becomes more and more advanced, information systems tend to become larger and more complex. In the field of data processing applications, extremely high data throughput is required, which requires mass storage systems to meet the demand. Most of the existing storage test benchmark tools are oriented to small-scale storage systems, and most of them only care about the efficiency of storage systems. [0003] For example, the Chinese patent document CN101630534A discloses a method and device for testing the reliability of non-volatile memory. m N blocks are respectively selected in each of the non-volatile memories of blocks, and the test program is executed T times respectively for the selected K×N blocks to o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/10
Inventor 潘清张晓清王霄军庄泽南
Owner 中国人民解放军装备指挥技术学院
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