Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Parallel analog-to-digital conversion device and method for controlling deflection of analog-to-digital conversion channels

A technology of analog-to-digital conversion and analog-to-digital converter, applied in the direction of analog-to-digital converters, etc., can solve the problems that the response characteristics of the control loop are easily affected by the external environment, reduce the utilization rate of equipment, and poor reliability, etc., and achieve significant cost Advantages, ease of digitization, effects of suppressing skew

Inactive Publication Date: 2011-04-27
ZTE CORP
View PDF4 Cites 21 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this type of method needs to use at least one ADC channel for deviation comparison, which reduces the utilization rate of the equipment and increases the cost; moreover, the compensation circuit is mostly implemented by an analog circuit, and the response characteristics of the control loop are easily affected by the external environment. influence, so the reliability is poor

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Parallel analog-to-digital conversion device and method for controlling deflection of analog-to-digital conversion channels
  • Parallel analog-to-digital conversion device and method for controlling deflection of analog-to-digital conversion channels
  • Parallel analog-to-digital conversion device and method for controlling deflection of analog-to-digital conversion channels

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] The technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings and preferred embodiments. The following examples are only used to illustrate and explain the present invention, but not to limit the technical solution of the present invention.

[0039] The present invention passes figure 2 The structure of an embodiment of a two-way parallel analog-to-digital conversion device is given. In fact, the present invention can be expanded and applied to the structure of more than two parallel analog-to-digital conversion devices.

[0040] Assume that the highest sampling rate of the existing ADC is 20GSa / s, and the required ADC sampling rate is 40GSa / s, so the design uses two ADCs (2 pieces of ADC) to work in parallel, and requires the skew of the output signals of the two ADCs Less than 5ps.

[0041] figure 2 The illustrated embodiment of the parallel analog-to-digital conversion device includes: a clock d...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a parallel analog-to-digital conversion device and a method for controlling deflection of analog-to-digital conversion channels. The conversion device comprises a clock device and a comprehensive detection processor, wherein the clock device outputs clock signals processed by phase adjustment to a sampling holder, so that the clock signals are sampled by a sampling holder and are subject to analog-to-digital conversion by an analog-to-digital converter; and the comprehensive detection processor detects to acquire the deflection amount of each analog-to-digital conversion channel according to the digital signals converted by the analog-to-digital converter, feeds the clock signals, which are obtained by carrying out corresponding phase adjustment on the clock signals output by the clock devices according to the deflection amounts, to the clock device. The invention has obvious cost advantage; the control method is flexible and simple, and can not be easily influenced by the external environment; and the sampling clocks can be locked on any required phases.

Description

technical field [0001] The invention relates to a parallel analog-to-digital conversion device, in particular to a parallel ADC device and a method for controlling ADC channel skew. Background technique [0002] An analog-to-digital converter (ADC, Analog Digital Converter) refers to an electronic component that converts an analog signal into a digital signal. The most important parameter of an analog-to-digital converter is the sampling rate, which defines the number of samples per second that are extracted from an analog signal and converted into a digital signal. The higher the sampling rate, the stronger the ability of the converter to process the input signal, and the better the performance of the converter. [0003] With the development trend of the communication industry towards high speed, large capacity and high bandwidth, the new generation of optical transmission communication system, especially in the 100G Ethernet system, in order to enhance the transmission ca...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/12
Inventor 高健
Owner ZTE CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products