Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for evaluating single-particle effect index of satellite device

A technology of single event effect and single event reversal, which is applied in the field of evaluation of single event effect indicators of satellite devices, can solve the problem of not comprehensively and deeply developing the risk index system of device single event effect, and not establishing a single event effect risk index system of satellite devices And other issues

Inactive Publication Date: 2012-07-25
BEIJING SHENGTAOPING TEST ENG TECH RES INST
View PDF0 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, domestic research in this area is in its infancy, and the research on the single event effect risk index system and calculation methods of devices has not been comprehensively and deeply carried out. It is mainly limited to the tracking of foreign technologies, and the single event effect risk index system for satellite devices has not been established. Evaluation process of effect index and calculation method of single event effect index

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for evaluating single-particle effect index of satellite device
  • Method and system for evaluating single-particle effect index of satellite device
  • Method and system for evaluating single-particle effect index of satellite device

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0118] Assuming N=1, T=1 day, then T=8.64×10 4 s,

[0119] Then there is the formula T*FLUX1<1

[0120] (8.64×10 4 )×(FLUX1)2 , Therefore, FLUX1-5 / s.cm 2

[0121] FLUX2-7 / s.cm 2

[0122] Check the corresponding map of LET---FLUX integrated spectrum, LET1 is about 26MeVcm 2 / mg,

[0123] LET2 about 31MeV cm 2 / mg. That is, the LET threshold ranges from 26 to 31 MeVcm2 / mg.

example 2

[0125] Assuming N=0.04, T=1 day, then T=8.64×10 4 s, assuming that the maximum number of single particles encountered per square centimeter of sensitive area is less than 0.04, that is, a certain safety margin is properly considered, then during the mission, the maximum number of single particles encountered per square centimeter of sensitive area is:

[0126] T×FLUX1=(8.64×10 4 )×FLUX12 ,

[0127] Then FLUX1=4.6×10 -7 / s.cm 2

[0128] FLUX2=4.6×10 -9 / s.cm 2

[0129] Check the corresponding graph of LET---FLUX integrated spectrum, LET1 is about 30MeV cm 2 / mg, LET2 is about 37MeV cm 2 / mg. That is, the LET threshold range is 30~37MeV cm 2 / mg, to verify the rationality of the LET threshold range setting.

[0130] According to the number of single particles encountered in all sensitive areas during the mission, combined with the criticality of the system's mission and device availability, and the project progress stage, select an appropriate LET threshold range. For example, the LET t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for evaluating a single-particle effect index of a satellite device. The evaluating method comprises the following steps of: acquiring a single-particle turnover test value of a to-be-evaluated device by testing or simulating; calculating a single-particle turnover index required prediction value, required by a task, of the to-be-evaluated device; acquiring a radiation design margin according to a test expected value of the single-particle turnover index of the device and the single-particle turnover index required prediction value; and evaluating the radiation risk level of the device according to the radiation design margin. According to the technical scheme, the method for evaluating the single-particle effect index of the satellite device can effectively direct the model selection of the satellite device by calculating the single-particle turnover rate index of the device, and provide quality assurance for the satellite to victoriously finish the task.

Description

Technical field [0001] The present invention relates to the field of risk assessment of satellite devices, in particular to a method and system for evaluating single event effect indicators of satellite devices. Background technique [0002] In the complex and harsh space radiation environment, the device will have a single event effect, causing the circuit logic state to flip "0" or "1", or causing the circuit to cause logic state errors, circuit latch-up, circuit burnout, etc. There are two types of single event effects: non-destructive single event effects and destructive single event effects. Single event flips, transients, and function suspension are non-destructive single event effects, and single event lock-in, burnout, and gate penetration are all damages. Sexual single event effect. In order to improve the survivability of the device in the space orbit, the anti-radiation reinforcement technology can be used to slow down or protect the impact of the single event effect ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 王群勇阳辉陈冬梅陈宇白桦钟征宇郭明银刘燕芳宋岩吴文章
Owner BEIJING SHENGTAOPING TEST ENG TECH RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com