Chip testing device and chip testing method

Abstract

The invention discloses a chip testing device and a chip testing method. The chip testing device comprises an instruction generating module, a transmitting / receiving module and a control module. After the instruction generating module generates a first testing instruction, the transmitting / receiving module transmits the first testing instruction to a radio frequency identification label chip, andreceives a target testing result from the radio frequency identification label chip. The control module is used for judging whether the target testing result accords with a reference testing result or not. If the target testing result does not accord with the reference testing result according to the judgment result of the control module, the control module controls the instruction generating module to generate a second testing instruction for retesting the radio frequency identification label chip. The chip testing device and the chip testing method can achieve the effect of automatic randomand repeated testing on RFID label chips, and can improve the coverage rate of a testing instruction range of the RFID label chips besides saving time and labor of a user spending on editing the testing instruction.

Description

technical field [0001] The invention relates to a radio frequency identification technology, in particular to a test device and a test method applied to radio frequency identification tag chips. Background technique [0002] For radio frequency identification (Radio Frequency Identification, RFID) tag manufacturers, how to verify that the RFID tag chip they designed has no errors and conforms to the definition of one (or more) RFID protocols is a very important issue. . In the prior art, before each RFID tag chip test, the RFID protocol supported by the chip must be confirmed first, and then the corresponding test command can be manually edited for the chip to test. [0003] However, using this RFID tag chip testing method to test the RFID tag chip not only requires the user to spend a considerable amount of time and energy on editing the test instructions, but also can only test several common test instructions. In addition to providing a variety of test items to improve ...

AI Technical Summary

Problems solved by technology

[0003] However, using this RFID tag chip testing method to test the RFID tag chip not only requires the user to spend a considerable amount of time and energy on editing the test instructions, but also can only test several common test instructions. In addition to providing a variety of test items to improve the coverage of the test command range, it cannot truly achieve the effect of automated random testing of RFID tag chips

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