Automatic testing system of temperature compensating crystal oscillator

Abstract

The invention discloses an automatic testing system of a temperature compensating crystal oscillator, comprising a power supply, an incubator, a data transmission module, a plurality of crystal oscillating gate modules, a display module and a center control module, wherein the crystal oscillating gate modules comprise a plurality of testing control boards, a plurality of groups of decoders and a plurality of switches, wherein the testing control boards are arranged in the incubator; each testing control board is provided with a plurality of crystal oscillators to be tested; the center controlmodule comprises a computer, a frequency scale, a frequency meter and a temperature control unit, wherein the frequency meter is respectively and electrically connected with the frequency scale and the computer and provided with an interface connected with the crystal oscillators to be tested; and the computer is electrically connected with the crystal oscillators to be tested respectively through the crystal oscillating gate modules and the data transmission module and is also electrically connected with the incubator through the temperature control unit. The invention can test and compensate the crystal oscillator in large scale and high efficiency.

Description

technical field [0001] The present invention relates to crystal oscillators, and more particularly to an automatic test system for temperature-compensated crystal oscillators. Background technique [0002] With the development of society, crystal oscillators have become an essential part of the electronic communication industry due to their high frequency stability. However, the output frequency of the crystal oscillator is not absolutely stable, it will change with the change of temperature, and the change is more random and the consistency is poor, so the introduction of compensation has become a means to increase the frequency stability of the voltage-controlled crystal oscillator. [0003] At present, the most commonly used is to add a temperature compensation resistor network to the front end of the crystal oscillator, which is an analog compensation method. The frequency of the crystal oscillator is controlled by the output voltage of the compensation network. Using th...

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Problems solved by technology

[0004] However, the existing digital compensation methods usually adopt a one-by-one compensation method, which requires a lot of time and manpower, and the production efficiency is extremely low

However, only a small number of crystal oscillator manufacturers in China have their own temperature-compensated crystal oscillator test systems. Judging from the test results of crystal oscillators, the accuracy cannot meet the requirements, and products at the same frequency in narrow areas interfere seriously with each other, and the efficiency of mass testing is high. Low and other disadvantages

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