Method for building eye pattern and carrying out eye pattern template test

Abstract

The invention discloses a method for building an eye pattern and carrying out an eye pattern template test, which comprises the following steps that: firstly, a signal acquisition module is triggered once to acquire a string of continuous data signals without acquisition bland space; secondly, the acquired signals are stored in a storage module and a software phase-locked loop is used to recover a clock signal from the stored data; thirdly, according to the recovered clock signal, a stored waveform signal is divided into data segments with a fixed length, and the data segments are aligned one by one and overlapped together to form an eye pattern; and finally, the formed eye pattern is compared with a template to complete the template test.

Description

technical field [0001] The invention relates to a method for constructing an eye diagram and performing eye diagram mask testing in a measuring instrument, in particular to an eye diagram construction method based on phase-locked loop clock recovery and single long acquisition. Background technique [0002] The eye diagram refers to dividing the serial signal into several data segments on the test instrument, and overlapping and displaying these data segments to form a graph like an open human eye. From the eye diagram, the influence of intersymbol crosstalk and noise can be observed, so as to estimate the quality of the system. In addition, this graph can also be used to adjust the characteristics of the receiving filter to reduce the intersymbol interference and improve the transmission performance of the system. With the continuous increase of the serial signal rate, the timing information of the signal is more and more important, which requires the measurement instrumen...

AI Technical Summary

Problems solved by technology

The recovered clock is the best for testing timing errors relative to other reference signals. The phase-locked loop can be implemented by analog devices or by software or digital methods. The clock recovered by the analog phase-locked loop may contain the analog device itself. Inherent jitter, and is greatly affected by changes in the external environment. The most important thing is that this clock can only be used for triggering but not for subsequent tests because it cannot be stored

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