Detecting architectural vulnerability of processor resources

A processor and vulnerability technology, applied in error detection/correction, electrical digital data processing, instrumentation, etc., can solve problems such as power and performance consumption

Inactive Publication Date: 2009-10-28
INTEL CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

As a result, the power and performance cost of this mechanism is a fixed penalty

Method used

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  • Detecting architectural vulnerability of processor resources
  • Detecting architectural vulnerability of processor resources
  • Detecting architectural vulnerability of processor resources

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Embodiment Construction

[0016] In various embodiments, quantized AVF (Q-AVF) can provide a real-time indication of architectural vulnerability during processor execution. This Q-AVF can be significantly different from the average AVF. Because Q-AVF is a real-time indicator of architectural vulnerability, embodiments can make full use of this information to control error mitigation hardware. That is, the embodiment can measure the quantified AVF metric and determine whether to use error mitigation hardware based on the measurement, and the degree of such use. For example, one or more thresholds can be set for acceptable vulnerability and mitigation hardware can be activated when Q-AVF exceeds a given threshold. In this way, faulty hardware can be dynamically controlled, thereby saving power and improving performance when the vulnerability is low, and only when the fault vulnerability is actually high will cause these penalties in exchange for increased reliability.

[0017] Some examples of such savings c...

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Abstract

In one embodiment, a quantum detector is provided to detect a vulnerability measure for a processor based on a processor metrics each associated with operation of a processor structure during a quantum, along with a controller to control an error mitigation unit based on the vulnerability measure. Other embodiments are described and claimed.

Description

Technical field [0001] The invention relates to detecting the structural vulnerability of processor resources. Background technique [0002] For processor designers, soft errors caused mainly by radiation caused by neutron particles have become a major problem. Since this type of error does not reflect a permanent failure of the device, it is called a soft error or transient error. These bit upsets from transient errors are an addition to those caused by alpha particles from bumps and packaging materials. It is expected that in the next few generations of chips, the exponential increase in the number of transistors on a single chip and aggressive voltage scaling will make this problem worse. [0003] In order to solve the cosmic ray attack, some methods try to use some form of error detection (such as parity check) to protect a large part of all the latches in the processor or other semiconductor devices. Similarly, most major arrays in high-performance microprocessors, such as c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/00G06F11/36
CPCG06F2201/88G06F11/002G06F11/3466G06F11/3409Y02D10/00
Inventor A·比斯瓦斯N·桑达拉拉彦S·穆克赫吉
Owner INTEL CORP
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