Test device for testing at least one electronic control system and method for operating test device

Abstract

The present invention relates to a test device (2) for testing at least one electronic control system (1), and corresponding methods for operating the test device, wherein, wherein the testing device (2) has an addressable physical memory, and is connected to an electronic control system 1 through a data channel. The test device is also suitable for being arranged for calculating an environmental model 21 and realizing the test model 22. Wherein the environmental model 21 can be described by the environmental model variable stored under physical address of fixation in memory location. The test device 2 also contains a unit 23 for assignment in which assignment to physical address of memory is stored in readable, for the environmental model variable.

Description

【Technical field】 [0001] The invention relates to a testing device for testing at least one electronic control system, in particular a control unit used in vehicle technology, in particular motor vehicle technology. The invention also relates to a method of operating a test device. 【Background technique】 [0002] The test equipment is suitable and arranged to establish a connection via a data channel with the control system to be tested. In addition, an environment model can be calculated and at least one test model can be executed on the test device. During execution the environment model can interact with the control system via the data channel by outputting environment model data to the control system and by receiving control system data from the control system. The test model can be used to influence the environment model, influence calculations of the environment model and / or influence the electronic control system. Furthermore, the environment model can be described...

AI Technical Summary

Problems solved by technology

[0007] However, while bringing this real-time running advantage, there are also disadvantages: in the currently known arrangement structure of test equipment or test equipment and configuration equipment, it is possible to pass the test model during the operation of the environment model and the test model, that is, from the configuration The device triggers changes to environment model parameters, so-called environment model variables

Therefore, it will be laborious, troublesome and time-consuming to obtain the physical address of the storage location of the environment model variables in the test model, and at the same time, the application flexibility of the test model is very poor

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