LCD testing and connecting device and method for making same

Abstract

The invention provides a test connection device of a liquid crystal display screen, which is connected with a liquid crystal display screen to be tested and a test circuit so as to test the liquid crystal display screen to be tested. The test connection device is composed of at least one probe trace, wherein the probe trace respectively corresponds to at least one trace of the liquid crystal display screen to be tested; at least one probe trace is respectively and electrically connected with at least one trace of the liquid crystal display screen to be tested so as to transmit control signals transmitted by the test circuit to the liquid crystal display screen to be tested. The invention also provides a manufacture method for the test connection device of the liquid crystal display screen. The test connection device of the liquid crystal display screen and the manufacture method thereof have the advantages of simple operation, convenient identification, convenient use for manufacturers, little manufacture difficulty and lower cost, and overcome the defect that a metal probe lacerates an ITO trace during the test of short circuit. The invention not only can be used for shipment detection for the liquid crystal display screen, but also can be used for supplied materials detection for the liquid crystal display screen, besides, the liquid crystal display screen with the defects of short circuit and/or open circuit from flowing into the next procedure or client are prevented.

Description

technical field [0001] The invention relates to the field of liquid crystal display testing, in particular to a liquid crystal display testing connection device and a manufacturing method thereof. Background technique [0002] At present, dot-matrix liquid crystal displays are widely used. The circuit of this kind of liquid crystal display is highly dense, and the minimum interval of circuit wires is only 12 microns. The process control requirements of the company are strict, and any problem in any link will lead to short-circuit defects. [0003] In order to test the above-mentioned short-circuit defects, there is a probe card tester. After the liquid crystal display is made, the liquid crystal display is placed on the probe card tester, so that the probes of the probe card tester are connected to the liquid crystal display. The IC bonding leads on the LCD screen are in contact with conduction, and the LCD screen is driven to display the full screen and / or part of the test...

AI Technical Summary

Problems solved by technology

This detection method is convenient and intuitive. A variety of LCD screens can share the test circuit only by replacing the probe card. The disadvantage is that the production cost of the probe card is high, the production is difficult, and the positioning of the contact with the IC bonding lead of the LCD screen more difficult

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