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Nondestructive inspection method and device for internal defect of workpieces by x-ray diffraction x scan

A technology for internal defect, non-destructive testing, applied in measurement devices, material analysis using radiation, material analysis using wave/particle radiation, etc., can solve problems such as time-consuming and impractical

Inactive Publication Date: 2009-02-04
SOUTHWEST TECH & ENG INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Obviously, if one can think of using the above method to non-destructively detect the internal defects of the workpiece under test, it will take too long to be practical

Method used

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  • Nondestructive inspection method and device for internal defect of workpieces by x-ray diffraction x scan
  • Nondestructive inspection method and device for internal defect of workpieces by x-ray diffraction x scan
  • Nondestructive inspection method and device for internal defect of workpieces by x-ray diffraction x scan

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0060] Embodiment 1: see attached figure 1 , an X-ray diffraction scanning device for non-destructively detecting internal defects of a workpiece, comprising an X-ray source 1, an incident collimator 2, a three-dimensional displacement platform 4, a parallel limit receiving collimator 5, a detector 6, a goniometer 7, X-ray source controller 8, multi-channel energy analyzer 9, computer 10; it is characterized in that: the corresponding detection unit of described detector / detector array 6 is placed in the X-ray diffraction beam that it receives and incident to the measured The included angle of the incident X-ray beam of the workpiece is the diffraction angle 2θ hkl ; where, the diffraction angle 2θ hkl It is equal to the diffraction angle corresponding to the diffraction peak of a certain crystal material (hkl) crystal plane of the measured workpiece, which satisfies the Bragg equation 2dhklSinθ hkl = lambda , where d hkl is the distance between (hkl) crystal planes, lam...

Embodiment 2

[0068] Embodiment 2: see attached figure 1 , the method and device adopted in this example are basically the same as in Example 1, except that the focal spot of the tungsten target is 1mm×1mm, the tube voltage is 200KV, and the tube current is 2mA. The step-by-step measurement of diffraction intensity time is 10 seconds, y=6~33mm, Δy=0.2mm).

[0069] The workpiece to be tested is an image quality meter inserted in the middle of a 25mm thick compressed aluminum powder sample. The image quality meter has 5 steel needles with different diameters, and the distance between the 5 steel needles is about 5mm. Among them, the diameter of the thinnest steel needle is 0.2 mm.

[0070] Fig. 8 is the X-ray diffraction one-dimensional scanning non-destructive testing results of an image quality meter inserted in the middle of a 25mm thick compacted aluminum powder sample, in which the five concave parts of the test curve (that is, the minimum values ​​of the five diffraction count intensi...

Embodiment 3

[0071] Embodiment 3: see attached figure 1 , The method and device used in this example are basically the same as those in Example 1, except that the multi-channel energy analyzer is replaced by a single-channel energy analyzer, and the upper and lower thresholds are set, and only the Kα characteristic X-ray diffraction line of tungsten is accepted.

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Abstract

The present invention relates to a nondestructive testing method of X-ray diffraction which is used for detecting the internal defect of a workpiece which is made of crystal material (including single-crystal materials and polycrystalline materials) or material which contains atoms arranged in sequence along the one-dimensional space, and a device thereof, in particular suitable for detecting the internal defect of the workpiece made of material which consists of atoms of low atomic number. The method adopts the nondestructive test to get the intensity distribution map of diffraction of materials in all internal parts of the tested workpiece; then the nondestructive test is adopted to analyze the internal defect, the defect type and distribution of the tested workpiece. The X-ray tube radiation of easily available heavy metal anode target, which can be industrialized and practically applied, can be used in the rapid nondestructive test of the internal defect and the defect type of aluminum and magnesium workpieces which have a thickness of a plurality of millimeters; and the spatial resolution is superior to the existing X-ray detection machine and X-ray CT.

Description

Technical field [0001] The invention relates to a method and device for non-destructively detecting defects within a workpiece of crystal materials (including single crystal materials and polycrystalline materials, or materials containing atoms arranged in an orderly manner along one-dimensional space, such as fiber-reinforced composite materials) using X-ray diffraction scanning. , is especially suitable for non-destructive testing of internal defects and their distribution in workpieces made of the above-mentioned materials composed of lower atomic number atoms (hereinafter referred to as low-z materials). Background technique [0002] At present, instruments and equipment based on X-ray transmission method or ultrasonic method are commonly used to non-destructively detect internal defects of workpiece materials, such as X-ray flaw detectors, X-ray CT or C-ultrasound scanners, etc. Among them, X-ray CT and C-ultrasound scanners can not only detect the spatial shape and siz...

Claims

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Application Information

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IPC IPC(8): G01N23/18G01N23/207
Inventor 郑林何长光彭正坤张津唐伦科
Owner SOUTHWEST TECH & ENG INST
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