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RPC model parameter extraction method and geometric correction method

A technology of model parameters and extraction methods, which is applied in the field of remote sensing images, can solve the problems that the correction accuracy is greatly affected by the elevation accuracy and cannot satisfy large-scale mapping, and achieve the effect of improving robustness and accuracy

Inactive Publication Date: 2008-07-09
WUHAN UNIV
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Problems solved by technology

Since the terrain elevation actually changes randomly, although the existing RPC model takes into account the influence of elevation, areas with large terrain fluctuations still cannot meet the needs of large-scale mapping, and the correction accuracy is greatly affected by the elevation accuracy.

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  • RPC model parameter extraction method and geometric correction method
  • RPC model parameter extraction method and geometric correction method

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Embodiment Construction

[0035] The random field theory was born in the early 20th century, mainly with the help of probability theory and statistical methods to study the statistical regularity of dynamic and overall random phenomena that change with spatial variables. Recent studies have shown that elevation is random in nature and can be modeled as a stationary random field. The deformation caused by terrain fluctuations is randomly distributed in the image space, and the present invention uses the errors in the X and Y directions of the image points after the rough correction of the image as random fields to fit them. Using the point error after the initial correction of the control point, the variogram of the X and Y directions of the error of each pixel in the image space (the general specification in the field of remote sensing is corresponding to the east and north direction) is obtained, which is used as the correlation measure of the spatial pixel. Through the solution of the variogram, the ...

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Abstract

The invention belongs to the field of remote sensing image and particularly relates to a RPC model parameter extraction method and a RPC model geometric correction method. The technique scheme of the invention simulates elevation change to a random field and constructs Kriging equations according to the observed values of a plurality of random variables based on stationary random field theory, thus obtaining the optimal bias-free interpolation of unobserved points. The RPC model parameter extraction method provided by the invention can acquire high-accuracy PRC model parameters based on a stationary random field model to ensure the RPC geometric correction accuracy. The RPC model geometric correction method provided by the invention can ensure the accuracy of the final geometric correction result by carrying out crude correction based on a common RPC model and carrying out fine correction based on the stationary random field model. By adopting the stationary random field model to assist the RPC geometric correction, both the two methods can improve the robustness and the accuracy of geometric correction of the universal sensor for remote sensing image even if the assistant means are different.

Description

technical field [0001] The invention belongs to the field of remote sensing images, in particular to an RPC model parameter extraction method and an RPC model geometric correction method. Background technique [0002] As mankind enters the space age and gradually enters the information age, various remote sensing platforms operating in space continue to observe our earth in different ways and at different scales, and continuously provide information that cannot be obtained on the earth's surface. information, so that the human vision has been extended to the largest scale. To extract information from satellite remote sensing images, it is necessary to project the remote sensing images in a fixed reference system and correct the geometric deformation of the original image (usually called image geometric correction), so as to carry out geometric measurement and interaction of image information. Comparative and Composite Analysis. Errors generated at this stage will affect a ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S7/48G01S17/89G06F17/10
Inventor 马洪超姚春静邬建伟
Owner WUHAN UNIV
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