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Dissimilar spectrometer contrast method

A spectrometer and imaging spectrometer technology, applied in interference spectroscopy, using refraction elements to generate spectra, using diffractive elements to generate spectra, etc. for simple effects

Inactive Publication Date: 2008-03-19
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to provide a comparison method of different types of spectrometers, which solves the problem of using different types of spectrometers to check and calibrate in the technical background, the qualitative comparison is difficult, and quantitative checking cannot be performed; Nucleation and calibration, high cost, and difficult technical problems in design and production

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Embodiment Construction

[0026] Analysis of the principle of the present invention:

[0027] 1. Take quasi-monochromatic light as an example, the wavelength is λ, and the wavenumber is σ. Let the wavelength resolution of the spectrometer be δλ, and the wavenumber resolution of the quasi-monochromatic light be δσ 0 .

[0028] (1.1) If a dispersive spectrometer is used, then in the wavenumber domain, the test spectrum B obtained by the dispersive spectrometer s (σ) is related to the original spectrum B(σ) as follows:

[0029] B s ( σ ) = B ( σ ) * [ 1 δ σ 0 · Π ( σ δ ...

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Abstract

The invention relates to a contrast method for different types of spectrographs. The spectral resolution of the shortest wave length is gained from equal wave length spectral resolution spectrometer data, the largest optical path difference of the interference data is gained from equal wave number spectral resolution spectrometer data, Fourier transformation is performed, the largest optical path difference is selected as the apodized function parameter of the interferogram of the equal wave length spectral resolution spectrometer data after the Fourier transformation, and the square apodized and Fourier reverse transformation are performed, and in the overlapped spectral coverage, the comparisons of the parameters such as the spectral intensity, the spectral line position, and the spectral resolution between the modificative spectrogram of the equal wave length spectral resolution spectrometer and the spectrogram of the equal wave number spectral resolution spectrometer which is to be compared are performed. The invention solves the technical problems that the checking and the standardizing are different and the cost is high by utilizing different types of spectrographs in the technical background. The invention can quantitatively check or standard the radiant emittance of varieties types of interference type spectrometers or interference type imaging spectrometers by utilizing an edge glass or a grating spectrometer with high radiating accuracy.

Description

technical field [0001] The invention relates to a method for unifying the spectrum measurement results of different types of spectrometers so that they can be compared with each other, in particular to a comparison method between a dispersion spectrometer and an interference spectrometer. technical background [0002] There are two main types of spectrometer principles: one is a dispersive spectrometer with prisms and gratings as dispersive elements, which can directly obtain the spectrum of the target. The other is an interferometric spectrometer with a Mais or Sagnac interferometer as the core, which can directly obtain the interference intensity distribution of the target, and requires Fourier transform to obtain the target spectrum. [0003] The spectral resolution of the dispersive spectrometer is represented by the wavelength λ, which is basically at equal intervals of the wavelength. This feature is called "equal wavelength resolution". , called "equal wavenumber res...

Claims

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Application Information

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IPC IPC(8): G01J3/12G01J3/14G01J3/18G01J3/26G01J3/28G01J3/45
Inventor 赵葆常薛彬杨建峰马小龙乔卫东李福
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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