Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Near-field scanning optical microscope poisitioned scanning-imaging method

A technology of near-field scanning optics and imaging method, applied in the field of scanning probe microscope, can solve the problem that NSOM does not have a high-precision positioning method, and achieve the effect of simple structure

Inactive Publication Date: 2008-09-24
NANKAI UNIV
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current NSOM does not have a high-precision positioning method

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0006] Embodiment 1: Establish a micron-scale positioning reference light-emitting point. The point light sources that can be used include: the end face of a single-mode optical fiber coupled with a laser, an illuminated small hole, a semiconductor laser on a tiny light-emitting surface, and the like. With the help of a traditional optical microscope, a two-dimensional fine-tuning device (readable and with an accuracy of 1 μm) is assembled on the sample stage. If the NSOM scanner is used to control sample scanning, the sample is fixed on the scanner, the scanner is fixed on the sample stage, the positioning reference luminous point is fixed on the sample stage or on the scanner, and the positioning reference luminous point is fixed on the sample stage Both the upper and the scanner require the sample to be at the same height as the positioning reference luminous point, the optical probe and the microscope objective lens are fixed together, and the tip of the optical probe is at...

Embodiment 2

[0007] Embodiment 2: Establish a micron-scale positioning reference light-emitting point. The point light sources that can be used include: the end face of a single-mode optical fiber coupled with a laser, an illuminated small hole, a semiconductor laser on a tiny light-emitting surface, and the like. On the basis of the existing NSOM, a two-dimensional fine-tuning device (readable and with an accuracy of 1 μm) is assembled on the NSOM sample stage. If the NSOM scanner is used to control the sample scanning, the sample is fixed on the scanner, the scanner is fixed on the sample stage equipped with the two-dimensional fine-tuning device, and the positioning reference luminous point is fixed on the sample stage equipped with the two-dimensional fine-tuning device or the scanner Above, whether the positioning reference luminescent point is fixed on the sample stage or on the scanner, it is required to keep the sample at the same height as the positioning reference luminescent poin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for a near field scan-optical microscope positioned scanning image is that by using micrometer dimension luminous points as the position reference points with the help of traditional optical micro scope and trimming flat table to observe by micro image device and measures in precision relative shift of the reference luminous points center and the target zone, adjusts optical probe to the center of the reference luminous optical probe, then further adjusts optical probe to the center of refrence luminous points according to the relative shift of the reference luminous points center and sample target zone, realizing NSOM positioning scanning and imaging with accuracy reaching to 1 micro meter.

Description

technical field [0001] The utility model belongs to the field of scanning probe microscopes. The technique involves positioning and scanning imaging of a near-field scanning optical microscope probe on the surface of a sample. Background technique [0002] Near-field scanning optical microscopy (NSOM) has ultra-high optical resolution (10nm) compared to conventional optical microscopy. In practice, most of the sample surfaces have different optical topography between local regions. The sample stage of a traditional optical microscope generally has a fine-tuning device, which can quickly observe the sample in a wide range by moving the sample. However, NSOM uses scanning imaging rather than direct imaging. The piezoelectric scanner controls the ultra-micro-optical probe for point-by-point imaging. The probes used are generally fiber optic probes, tetrahedral probes, etc., and the imaging time takes several minutes to more than ten Minutes, the imaging range is from a few m...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N13/14G02B21/00G01Q60/18
Inventor 张天浩吴朝晖张春平张光寅颜彩繁杨嘉孙磊
Owner NANKAI UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com