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Apparatus for detecting parallelism of two planes of platelike workpiece

A technology for plane parallelism and plate-shaped workpieces, which is applied in the field of detection devices, can solve the problems of inability to simultaneously collect workpiece position data, expensive measurement methods, and impracticality, and achieve the effects of reduced measurement costs, simple structure, and convenient operation

Inactive Publication Date: 2007-03-28
SHANGHAI UNIV
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Problems solved by technology

[0002] The currently known technology of measuring the plane parallelism of the workpiece is carried out on a three-dimensional coordinate measuring machine. This is not a special equipment for measuring the plane parallelism. It is characterized by contact measurement, that is, the probe of the three-dimensional coordinate measuring The workpiece is measured, and during the measurement process, the position data of the points on the two planes to be measured cannot be collected at the same time, that is, the workpiece must measure the position data of the points on one side before turning it over to measure the other side, and then according to these points in the computer Re-fit the two planes in the middle, and further evaluate the parallelism of the two planes. This measurement method is expensive and inefficient. For the measurement of some workpieces that only strictly require the parallelism of the upper and lower planes, this measurement method is not very practical.

Method used

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  • Apparatus for detecting parallelism of two planes of platelike workpiece
  • Apparatus for detecting parallelism of two planes of platelike workpiece
  • Apparatus for detecting parallelism of two planes of platelike workpiece

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Embodiment Construction

[0016] A preferred embodiment of the present invention is described as follows in conjunction with accompanying drawing:

[0017] Fig. 1 is a perspective view of the structure of the device for detecting the parallelism of two planes of a plate-shaped workpiece, which includes: a base 1, on which a vertical side plate 2 is arranged, and a lateral movement is installed on the side of the vertical side plate 2 located directly above the base 1 Mechanism 3, the lateral movement mechanism 3 is connected with the vertical movement mechanism 7 of the laser sensor through the vertical connecting plate 20, and drives the vertical movement mechanism 7 of the laser sensor to reciprocate laterally, at the same time, a grating ruler 4 is installed above the transverse movement mechanism 3, The movable part 6 of the grating ruler 4 is connected with the vertical connecting plate 20 through the connection plate 5, so that the grating ruler 4 can collect the displacement value of the lateral ...

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Abstract

This invention relates to a test device for measuring the depth of parallelism of two planes of a board-like workpiece including: a base set with a lateral moving unit with a laser sensor vertical moving unit and a grating ruler, at the same time, the movement part of the grating ruler is connected with the vertical moving unit fixedly, the other side of the base is installed with a slipway with a workpiece platform on it, when working, the two laser sensors mounted up and down are above and below the platform.

Description

technical field [0001] The invention relates to a detection device for non-contact measurement of the plane parallelism of two planes of a flat workpiece (upper and lower surfaces are planes), especially a special detection device for thin plate workpieces with high requirements on the parallelism of the upper and lower planes device. Background technique [0002] The currently known technology of measuring the plane parallelism of the workpiece is carried out on a three-dimensional coordinate measuring machine. This is not a special equipment for measuring the plane parallelism. It is characterized by contact measurement, that is, the probe of the three-dimensional coordinate measuring The workpiece is measured, and during the measurement process, the position data of the points on the two planes to be measured cannot be collected at the same time, that is, the workpiece must measure the position data of the points on one side before turning it over to measure the other sid...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00G01B21/00
Inventor 赵晓银李伟刘占兵李迎伟
Owner SHANGHAI UNIV
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