Measuring device and method for half-wave voltage and optical uniformity of electro-optical crystal material

Abstract

This invention relates to a measurement device and method of photoelectric crystal material half wave voltage and optical homogeneity, which comprises He-N3 laser, polarizer plate beam splitter, total reflector, analyzer, photodiode, galvana meter, and DC high voltage power source, with indluded angle of 45 deg. or 135 deg. between plate beam splitter and incident angle. The tested crystal with electrode coated with silver on and under surface is put on the plate beam splitter to switch on the laser to tune the analizer and polarizer to cross or parallel before adding voltage to the crystal and the tested light intensity signals are I1, I2, I2 / I1 is the static extinction ratio and voltage is enlarged to turn the light intensity signal of galvanameter to the largest, the added voltage on the crystal is the half-wave voltage and the light intensity signal is I3, I3 / I1 the dynamic extinction ratio.

Description

(1) Technical field [0001] The invention relates to a measuring device and method for half-wave voltage and optical uniformity of electro-optic crystal materials, in particular to the measurement of the static extinction ratio, dynamic extinction ratio and half-wave voltage of an electro-optic crystal with optical activity. (2) Background technology [0002] Static extinction ratio, dynamic extinction ratio and half-wave voltage are some of the most basic and important parameters to characterize electro-optic crystal materials. Currently used electro-optic crystal materials are optically inactive, such as LiNbO 3 and DKDP et al. Recently, we have taken the lead in studying the optically active La 3 Ga 5 SiO 14 Crystal (referred to as LGS) half-wave voltage and optical uniformity, and has made it into an electro-optical Q switch. [0003] The so-called optical rotation means that after the monochromatic plane polarized light passes through the crystal along the optical a...

AI Technical Summary

Problems solved by technology

Since the light passes through the crystal once, the influence of the rotation angle of the polarization plane due to optical rotation on the half-wave voltage and optical uniformity parameters cannot be eliminated

Therefore, it cannot be used to measure the static extinction ratio, dynamic extinction ratio and half-wave voltage of optically active electro-optic crystals.

Images