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Probe connecting structure for detecting tool of printed circuit board

A printed circuit board and connecting device technology, applied in the field of printed circuit board inspection tools, can solve problems such as poor conduction, high manufacturing cost, and small probes, and achieve the effects of avoiding bending under pressure, convenient manufacture, and simple structure

Inactive Publication Date: 2006-10-04
OHNISHI ELECTRONICS (KUNSHAN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In this solution, the probe is composed of an outer sleeve, a needle body and a spring, so there are the following defects: First, the structure of the probe is complex, and the manufacturing cost is high. At the same time, the structure with the spring inside is prone to insufficient strength, resulting in poor conduction , thereby affecting the inspection results; second, the casing structure prevents the probe from being made very small. With the continuous improvement of circuit integration, the existing printed circuit board wiring density is also increasing, especially the pin distance of some integrated circuits Very small, the probes are required to be very thin, and the distance between the probes is very small, and the structure of the probes in the prior art cannot adapt to this change

Method used

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  • Probe connecting structure for detecting tool of printed circuit board
  • Probe connecting structure for detecting tool of printed circuit board
  • Probe connecting structure for detecting tool of printed circuit board

Examples

Experimental program
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Embodiment 1

[0019] Embodiment one: see attached figure 1 to attach Figure 4 As shown, a probe connecting device for a printed circuit board inspection tool includes a probe 1 and a probe contact terminal 2. The probe 1 is an elongated needle-shaped structure with a tapered lower end surface. About one-third of the upper part of the needle 1 is provided with a boss 3 that cooperates with the return spring 4. The boss 3 is a cylindrical protrusion with an integral structure with the probe 1, and the contact terminal 2 of the probe is connected to the wire 7. , its upper end forms a thicker head 5, which is formed by punching the adjacent ends of the covered wires, and forms a concave structure on the upper end surface that matches the lower end of the probe 1. For example, it can be disclosed in the Chinese invention patent application CN1445551A The lower end of probe 1 is in contact with the upper end of probe contact terminal 2.

[0020] When in use, it is installed on the plate 8 in ...

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PUM

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Abstract

The invention discloses a probe connecting structure for detecting tools applied to printed circuit board, which includes probe and probe contacting terminal. The probe is thin pin structure, there arranges a convex desk matching with the reset spring on the probe, the probe contacting terminal is connected to the wire, the upper end face is matched with the lower part of he probe. It can be applied to the detection to printed circuit board, and it guarantees the excellent conductivity in structure.

Description

technical field [0001] The invention relates to a printed circuit board inspection tool, in particular to a probe connection device on the printed circuit board inspection tool. Background technique [0002] In the industrial production process, it is necessary to check the printed circuit board to determine whether there is a short circuit or an open circuit. Existing printed circuit board inspection tools usually include a base, a board, and a circuit testing device. Several probe connection structures are arranged on the board. Corresponding to the position of the feet, it is electrically connected to the circuit testing device through wires. The probe connection structure includes a probe and a probe contact terminal as a conductive contact. The probe is composed of an outer sleeve, a needle body and a spring. The bottom of the needle body in the tube enables the needle body to move elastically relative to the plate, the upper end of the probe co...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/067
Inventor 大西军八
Owner OHNISHI ELECTRONICS (KUNSHAN) CO LTD
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