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Sensor testing method, device and equipment and readable storage medium

A test method and sensor technology, which is applied in the field of image sensors, can solve the problems of low image retention measurement accuracy, and achieve the effect of simple test method, elimination of accidental errors, and high accuracy

Pending Publication Date: 2022-07-22
深圳锐视智芯科技有限公司
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AI Technical Summary

Problems solved by technology

[0005] The embodiment of the present application provides a sensor testing method, device, equipment, and readable storage medium, which can at least solve the problem of low accuracy in image retention measurement for image sensors after proton irradiation in the related art

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  • Sensor testing method, device and equipment and readable storage medium
  • Sensor testing method, device and equipment and readable storage medium

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Embodiment Construction

[0023] In order to make the purpose, features and advantages of the invention of the present application more obvious and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. The embodiments described above are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of this application.

[0024] In the description of the embodiments of the present application, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical" ", "horizontal", "top", "bottom", "inside", "outside", etc. indicate the orientation or positional relationship based on the orienta...

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Abstract

The invention provides a sensor testing method, device and equipment and a readable storage medium, and the method comprises the steps: controlling an APS image sensor after proton irradiation to continuously collect N frames of images in a non-illumination environment of a first image collection stage, and collecting a single frame of image in an illumination environment of a second image collection stage, acquiring M frames of images in a non-illumination environment in a third image acquisition stage; acquiring an average gray value of the N frames of images, and acquiring a target gray value of the last frame of image in the image acquisition period; and calculating image retention parameters of the APS image sensor after proton irradiation based on the average gray value and the target gray value. Through implementation of the scheme of the invention, accidental errors caused by single measurement can be eliminated by adopting a method of averaging multiple frames of images, the test method is simple, the accuracy of image retention detection is high, and effective support can be provided for radiation damage evaluation of the APS image sensor.

Description

technical field [0001] The present application relates to the technical field of image sensors, and in particular, to a sensor testing method, apparatus, device, and readable storage medium. Background technique [0002] Traditional types of image sensors include Complementary Metal Oxide Semiconductor (CMOS, Complementary Metal Oxide Semiconductor) image sensors, which have the advantages of small size, light weight, low power consumption, and high integration, and are widely used in star sensors, solar sensors, Remote sensing imaging and other space fields have played an important role in space missions such as star recognition, star tracking, attitude determination, space docking, feature tracking, landing imaging for landing control, and target tracking. In recent years, image sensors based on the CMOS Image Sensor (CIS) process have developed rapidly, and have become more and more widely used in automotive electronics, intelligent manufacturing, industrial monitoring, m...

Claims

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Application Information

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IPC IPC(8): G01M11/02
CPCG01M11/02
Inventor 张太永万小芳代政查颖云邓坚
Owner 深圳锐视智芯科技有限公司
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