Novel pulsed eddy current thickness measuring device and method
A pulsed eddy current and thickness measurement technology, used in measuring devices, electromagnetic measuring devices, electrical devices, etc., can solve problems such as unfavorable field applications, inability to detect ferromagnetic materials and non-ferromagnetic materials, and complicated operations, and achieve efficient positioning. and quantitative metal loss, high-precision scanning, and the effect of no couplant
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[0026] This part will describe the specific embodiments of the present invention in detail, and the preferred embodiments of the present invention are shown in the accompanying drawings. Each technical feature and overall technical solution of the invention should not be construed as limiting the protection scope of the invention.
[0027] In the description of the present invention, the meaning of several is one or more, the meaning of multiple is two or more, greater than, less than, exceeding, etc. are understood as not including this number, above, below, within, etc. are understood as including this number. If it is described that the first and the second are only for the purpose of distinguishing technical features, it cannot be understood as indicating or implying relative importance, or indicating the number of the indicated technical features or the order of the indicated technical features. relation.
[0028] In the description of the present invention, unless other...
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