Testing machine for generating arbitrary waveform CELL based on FPGA technology
An arbitrary waveform and testing machine technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of arbitrary waveforms generated by CELL testing machines, low degree of intelligence, etc., to achieve easy observation and analysis, signal stability, analysis. fast effect
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[0017] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Embodiments, and all other embodiments obtained by those of ordinary skill in the art without creative efforts, fall within the protection scope of the present invention.
[0018] In order to facilitate the understanding of the present invention, the present invention will be more fully described below with reference to the related drawings, and several embodiments of the present invention are given. However, the present invention can be implemented in many different forms, and is not limited to Examples, rather, these examples are provided so that this disclosure will be thorough and complete.
[0019] It should be noted that when an element is referred to as being "...
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