Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Planar optical flat calibrating device and calibrating method

A verification device, flat crystal technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of insufficient contrast of interference fringes, reduced efficiency of flat crystal verification instrument, and influence on the accuracy of results, so as to improve verification efficiency, The effect of shortening the warm-up time and improving the accuracy of the results

Active Publication Date: 2022-05-10
深圳众庭联合科技有限公司
View PDF7 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The traditional flat crystal calibrator uses sodium lamp, the monochromaticity is poor, the contrast of the interference fringes is not obvious enough, and it needs a long warm-up time when used; when observing, use the moving micrometer to read the interference fringe spacing and interference fringe bending The measurement error will be caused by human eye observation and manual operation, which will affect the accuracy of the result; at the same time, the flat crystal calibrator can only complete the verification of a single measured flat crystal, resulting in a decrease in the efficiency of the flat crystal calibrator

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Planar optical flat calibrating device and calibrating method
  • Planar optical flat calibrating device and calibrating method
  • Planar optical flat calibrating device and calibrating method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0026] see Figure 1 to Figure 2 , the present invention provides a technical solution: a plane flat crystal verification device, including a measured flat crystal 1, a standard flat crystal 2 is arranged on the bottom of the tested flat crystal 1, and a collimating objective lens is arranged on the top of the measured flat crystal 1 3. A baffle 4 is provided on the upper left of the collimating objective lens 3, and a small hole 41 is opened on the baffle 4, ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a planar optical flat calibrating device and method. The planar optical flat calibrating device comprises a detected optical flat, a standard optical flat is arranged at the bottom of the detected optical flat, a collimator objective is arranged at the top of the detected optical flat, a baffle is arranged on the upper left portion of the collimator objective, a small hole is formed in the baffle, and optical fiber laser is arranged on the side face of the baffle. A first reflector is arranged on the right side of the baffle, a second reflector is arranged right above the collimator objective, a spectroscope is arranged in front of the laser of the fiber laser, and a CCD camera is arranged on the right side of the spectroscope; according to the invention, a plane equal-thickness interference method is adopted, the interference pattern of the detected optical flat and the standard optical flat is acquired through the camera, and a planeness algorithm established by itself is adopted, so that the detection of the detected optical flat is completed, the planeness of a plurality of detected optical flat can be detected in parallel, and the detection efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of plane flat crystal verification, in particular to a plane flat crystal verification device and a verification method. Background technique [0002] As we all know, the flatness test optical plane flat crystal is an auxiliary device used in the process of industrial production and processing to detect the flatness of the plane of parts and improve product quality. It has been widely used in the technical field of flatness testing equipment , Parallel flat crystals are common tools used to measure block gauges by interferometry, and to test the bonding and flatness of block gauges, gauges, sealing surfaces of parts, measuring instruments and measuring tools. [0003] The traditional flat crystal calibrator uses sodium lamp, the monochromaticity is poor, the contrast of the interference fringes is not obvious enough, and it needs a long warm-up time when used; when observing, use the moving micrometer to rea...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/30
CPCG01B11/30
Inventor 张志庭郑剑峰刘晓峰黄晓川李黎明刘苗谢贤梅
Owner 深圳众庭联合科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products