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Test environment monitoring method and device and electronic equipment

A technology of testing environment and preset conditions, applied in the field of information, can solve the problems of inability to monitor in real time, low efficiency of testing environment monitoring, etc., so as to improve the monitoring efficiency and realize the effect of real-time monitoring.

Pending Publication Date: 2022-04-19
JD DIGITS HAIYI INFORMATION TECHNOLOGY CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present disclosure is to provide a test environment monitoring method, device and electronic equipment, which are used to overcome the inefficiency of the test environment monitoring caused by the limitations and defects of related technologies at least to a certain extent, and the inability to monitor in real time during the test process And other issues

Method used

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  • Test environment monitoring method and device and electronic equipment
  • Test environment monitoring method and device and electronic equipment
  • Test environment monitoring method and device and electronic equipment

Examples

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Embodiment Construction

[0027] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete and will fully convey the concept of example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of embodiments of the present disclosure. However, those skilled in the art will appreciate that the technical solutions of the present disclosure may be practiced without one or more of the specific details, or other methods, components, devices, steps, etc. may be adopted. In other instances, well-known technical solutions have not bee...

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Abstract

The invention provides a test environment monitoring method and device and electronic equipment. The test environment monitoring method comprises the steps of obtaining multiple groups of operation parameters corresponding to multiple target service modules of a target test environment, wherein each group of operation parameters comprises software operation parameters and hardware operation parameters; when one group of operation parameters meet a preset condition, marking a target service module corresponding to the operation parameters as abnormal; and displaying the monitoring states of a plurality of target service modules corresponding to the target test environment, and setting the target service module marked as abnormal as a first display effect. According to the embodiment of the invention, the abnormal state of the test environment can be visually reflected, and the test environment monitoring efficiency is improved.

Description

technical field [0001] The present disclosure relates to the field of information technology, in particular, to a test environment monitoring method, device and electronic equipment. Background technique [0002] Software testing is crucial to the launch of Internet products. In software testing, test scripts need to be run in a test environment to test related products. Therefore, the normal state of the software testing environment is a key factor to ensure product testing. [0003] In related technologies, it is usually necessary to run test cases regularly and determine whether the test environment is abnormal according to the running results. This method is inefficient when there are multiple test environments, and if the test environment is abnormal during the normal test process, it is very easy to cause abnormal test results. At this time, it is impossible to distinguish whether there is a problem in the test environment or the product. After testing the test envi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06F11/30
CPCG06F11/3664G06F11/302G06F11/3051
Inventor 张海燕董华丽
Owner JD DIGITS HAIYI INFORMATION TECHNOLOGY CO LTD
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