Test question selection method and device, electronic equipment and storage medium

Abstract

The embodiment of the invention provides a test question selection method and device, electronic equipment and a storage medium. The method comprises the steps that difficulty features and text features of all test questions in a question bank are determined; obtaining identity information, learning condition information and historical question-answering information of the target user, determining question-solving ability characteristics and historical question-answering characteristics of the target user according to the historical question-answering information, and determining basic characteristics of the target user according to the identity information and the learning condition information; obtaining the current learning progress of the target user, and determining a plurality of candidate test questions corresponding to the current learning progress from the question bank; for each candidate test question, inputting the difficulty feature, the text feature, the basic feature, the historical question doing feature and the question solving ability feature of the candidate test question into a pre-trained question prediction model to obtain a prediction accuracy rate corresponding to the candidate test question; and determining a target test question based on the predicted answering accuracy. By adopting the method, test questions conforming to the learning level of the user are provided for the user in a personalized manner.

Description

technical field [0001] The invention relates to the technical field of data processing, in particular to a test item selection method, device, electronic equipment and storage medium. Background technique [0002] In the traditional teaching process, the assignment of exercises to students is uniform. However, each student has a different degree of mastery of knowledge. It may appear that the same set of test questions is too difficult for high-level students and too difficult for low-level students. In some cases, students spend a lot of time doing the questions but fail to achieve the expected assessment goals or training goals. In order to avoid this kind of problem, at present, according to the knowledge points involved in the test questions and the students' mastery of the knowledge points, the test questions with a difficulty similar to the students' mastery of the knowledge points are selected from the question bank and sent to the students. [0003] However, in this...

AI Technical Summary

Problems solved by technology

[0003] However, in this method of selection of test questions, the difficulty of the test questions is mainly established around the knowledge points. When selecting the test questions, it is only based on the similarity matching between the knowledge points of the test questions and the students' mastery of the knowledge points. The standard for selecting test questions is relatively simple.

Moreover, different students may have similar mastery of knowledge points, but there may be a large gap in students' problem-solving ability. It is difficult to match the actual level of students with the test questions selected only based on students' mastery of knowledge points.

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