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Information technology chip testing device

A technology of chip testing and information technology, applied in the information field, can solve problems such as temperature measurement at untestable places, and achieve the effect of convenient, accurate and precise measurement of test temperature

Inactive Publication Date: 2022-03-15
谭文静
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It mainly applies computer science and communication technology to design, develop, install and implement information systems and application software, mainly including sensor technology, computer and intelligent technology, communication technology and control technology. The problem that the existing chip test device cannot accurately measure the temperature of the test place during use

Method used

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Embodiment Construction

[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention.

[0035] refer to Figure 1 to Figure 6 , an information technology chip testing device, including a housing 1 and a placement part 3, and a testing part 9 that is movably arranged inside the housing 1 through a third telescopic part 11, for testing the chips placed on the placement part 3, It also includes a vacuum mechanism 12 for adsorbing and fixing the chips;

[0036] The vacuum mechanism 12 includes a cavity 122 provided inside the placement part 3, the inner wall of the cavity 122 is provided with a perforation 121, and also includes a vacuum component for vacuuming the inside of the cavity 122;

[0037] The interior of the cavity 122 is provided with a movable...

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Abstract

The invention relates to the technical field of information, and discloses an information technology chip testing device, which aims to solve the problem that the existing chip testing device cannot accurately measure the temperature of a tested part during use, and comprises a shell, a placement part and a testing part movably arranged in the shell through a third telescopic part, the testing mechanism is used for testing the chip placed on the placing piece, and the vacuumizing mechanism is used for adsorbing and fixing the chip. When the chip is tested, the connecting part is in magnetic attraction connection with the second movable part, and when the testing part horizontally moves on the chip for testing, the connecting part drives the second movable part and the first movable part to move along with the moving track of the testing part. At the moment, the movable seat which is magnetically attracted with the first movable part horizontally moves along with the first movable part, so that the temperature measuring part moves along with the test part in the cavity, the test temperature can be accurately measured when different positions of the chip are tested, and the use is convenient and accurate.

Description

technical field [0001] The invention relates to the technical field of information technology, in particular to an information technology chip testing device. Background technique [0002] Information technology is a general term for various technologies mainly used to manage and process information. It mainly applies computer science and communication technology to design, develop, install and implement information systems and application software, mainly including sensor technology, computer and intelligent technology, communication technology and control technology. The problem is that the existing chip testing device cannot accurately measure the temperature of the testing place during use. Contents of the invention [0003] The purpose of the present invention is to solve the shortcomings in the prior art, and propose an information technology chip testing device. [0004] In order to achieve the above object, the present invention adopts the following technical sol...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/28
Inventor 谭文静
Owner 谭文静
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