Thermal process abnormal data detection method based on DBSCAN-SVC
A process abnormality and data detection technology, applied in the direction of data processing applications, instruments, character and pattern recognition, etc., can solve the problems of large deviation of detection results, original data influence, unclear physical meaning, etc., and achieve good data classification Accuracy, High Accuracy and Efficiency, Effect of Improving Clustering Accuracy
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[0040] In the description of the following embodiments, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
[0041] As used in this specification and the appended claims, the term "if" may be construed, depending on the context, as "when" or "once" or "in response to determining" or "in response to detecting ". Similarly, the phrase "if determined" or "if [the described condition or event] is detected" may be construed, depending on the context, to mean "once determined" or "in re...
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