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A calibration device and calibration method for the refractive index of a plane equal-thickness medium

A calibrating device, a technology of refractive index, applied in the direction of phase influence characteristic measurement, etc., can solve the problems of low refractive index accuracy and high refractive index accuracy, and achieve the effect of improving accuracy

Active Publication Date: 2021-12-14
苏州高视半导体技术有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As for flat and equal-thick media such as glass, there are many manufacturers that can provide them, and each company can provide hundreds to thousands of types. Many glasses cannot use the same standard ACF formula, that is, use a certain ACF formula to calculate the material between 400~ The refractive index in the 1100nm band will lead to higher accuracy of the calculated refractive index of some materials, while the accuracy of the refractive index of some materials is not high

Method used

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  • A calibration device and calibration method for the refractive index of a plane equal-thickness medium
  • A calibration device and calibration method for the refractive index of a plane equal-thickness medium
  • A calibration device and calibration method for the refractive index of a plane equal-thickness medium

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Embodiment 1

[0075] See Figure 1~4 as shown, figure 1 What is shown is a front view of a calibration device 1 for the refractive index of a plane equal-thickness medium provided by an embodiment of the present invention. In order to obtain a more accurate material refractive index formula, the calibration device 1 provided in this embodiment can measure the more accurate refractive index of the material at the same time. The calibration device 1 provided in this embodiment includes a spectral confocal sensor 11 and a spectrometer 14, which is characterized in that , also includes a distance adjustment mechanism, wherein the spectral confocal sensor 11 includes a white light point light source S, a half mirror X and a dispersion objective lens L; and the measured medium 13 are arranged in sequence along the optical axis, the half mirror X is close to the white light point light source S, and the dispersion objective lens L is close to the measured medium 13 side; the distance adjustment m...

Embodiment 2

[0142] Embodiment 2 provides a method for calibrating the refractive index of a plane equal-thickness medium, including the following steps:

[0143] A calibration device is provided, which includes a spectral confocal sensor 11, a spectrometer 14, and a distance adjustment mechanism. Wherein, the spectral confocal sensor 11 includes a white light point light source S, a half mirror X and a dispersion objective lens L; The half mirror X and the dispersion objective lens L are sequentially arranged along the optical axis between the white light point source S and the measured medium 13, the half mirror X is close to the white light point light source S, and the dispersion objective lens L is close to the measured medium Medium 13 side;

[0144] The distance adjustment mechanism drives the spectral confocal sensor 11 and the measured medium 13 to approach or move away from each other so that the distance between the dispersive objective lens L and the measured medium 13 changes ...

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Abstract

The embodiment of the present application discloses a calibration device and a calibration method for the refractive index of a plane equal-thickness medium. The calibration device includes a spectral confocal sensor spectrometer and a distance adjustment mechanism, wherein the spectral confocal sensor includes a white light point light A half mirror and a dispersion objective lens; the half reflection mirror and the dispersion objective lens are sequentially arranged along the optical axis between the white light point light source and the measured medium, the half reflection mirror is close to the white light point light source, and the dispersion objective lens is close to On the side of the measured medium: Calculate the refractive index curve of the measured medium according to the refractive index of the middle 4 wavelengths of the 6 different wavelengths detected, and then use the refractive indices of the wavelengths at both ends for calibration. According to the present invention, the accuracy of the predicted refractive index curve can be improved by correcting the coefficient of the wavelength term in the apochromatic characteristic formula, and then the accurate refractive index formula of the sample to be tested can be obtained, and the accurate refractive index curve of the sample can be obtained at the same time.

Description

technical field [0001] The invention relates to the field of calibrating the refractive index of transparent materials, in particular to a calibrating device and calibrating method for the refractive index of a plane equal-thickness medium. Background technique [0002] Refractive index is one of the basic parameters of optical materials. The refractive index of materials usually decreases with the increase of the wavelength of incident light. The difference between different wavelengths of refractive index is called dispersion. The research on the refractive index and dispersion of glass is of great significance for understanding the properties of glass materials, and it is also an essential parameter in the design of optical systems, and its size directly affects the imaging quality of the system. Accurately obtaining the refractive index values ​​of optical materials in the visible and near-infrared bands is very important for the production, use and optical design of opt...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/41
CPCG01N21/41
Inventor 不公告发明人
Owner 苏州高视半导体技术有限公司
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