Scanning control circuit and driving method thereof, shift register and display device

Abstract

The embodiment of the invention provides a scanning control circuit and a driving method thereof, a shift register and a display device, relates to the technical field of display, and aims to improve the circuit stability. The scan control circuit includes: a first control module that transmits voltages to a first node and a fourth node in response to a voltage of a first clock signal and a voltage of a third clock signal, and transmits voltages to a third node in response to the third clock signal; a pull-down module which responds to the voltage of the third node and the voltage of the first node and transmits the voltage to the first node; a second control module which responds to the voltage of the fourth node and transmits the voltage to the third node; a third control module which responds to the voltage of the third node, the voltage of the second clock signal and the voltage of the first node and transmits the voltage to the second node; and an output module which responds to the voltage of the first node and the voltage of the second node and outputs a scanning signal to the grid line.

Description

【Technical field】 [0001] The invention relates to the field of display technology, in particular to a scanning control circuit and its driving method, a shift register and a display device. 【Background technique】 [0002] The display device is provided with a plurality of cascaded scanning control circuits, and the scanning control circuits are used to output scanning signals to the gate lines to drive the display panel to display images normally. It can be understood that the scan control circuit is composed of multiple transistors and multiple nodes. During the operation of the scan control circuit, the potential of each node will change, thus causing the voltage difference across the transistor to change accordingly. [0003] However, based on the specific structure of the existing scanning control circuit, in the process of node potential change, the voltage difference between the two ends of the transistor will be too large, which will affect the stability of the transi...

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Problems solved by technology

[0003] However, based on the specific structure of the existing scanning control circuit, in the process of node potential changes, the voltage difference between the two ends of the transistor will be too large, which will affect the stability of the transistor, and in severe cases will affect the The working state of the entire scanning control circuit, which in turn causes the scanning control circuit to fail to output correct scanning signals

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