Measuring device

A measuring device and a technology to be tested are applied in the direction of measuring devices, measuring electrical variables, instruments, etc., and can solve the problem that the measurement accuracy is difficult to reach the uV/cm level.

Active Publication Date: 2021-09-03
TECH & ENG CENT FOR SPACE UTILIZATION CHINESE ACAD OF SCI
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Problems solved by technology

At present, the measurement of high-precision microwave mainly relies on traditional dipole antenna measurement, and the measurement accuracy is difficult to reach the uV / cm level.

Method used

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  • Measuring device

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Embodiment Construction

[0035] Such as figure 1 As shown, a measurement device according to an embodiment of the present invention includes a processor, a first excitation component, a first signal acquisition component, and an atomic gas chamber 12 filled with alkali metal atoms 22;

[0036] The first excitation component is used to excite the alkali metal atoms 22 in the atomic gas cell 12 from the ground state to the Rydberg state;

[0037] The first signal acquisition component is used to acquire the first signal data when the microwave to be detected changes the alkali metal atom 22 in the Rydberg state;

[0038] The processor is configured to calculate the field strength of the microwave to be detected according to the first signal data.

[0039] Wherein, according to the difference of the alkali metal atoms 22, the atomic gas chamber 12 is adjusted to different temperatures to ensure that the alkali metal atoms 22 are in a gasified state, and the alkali metal atoms 22 are sodium atoms, potass...

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Abstract

The invention relates to a measuring device, which comprises a processor, a first excitation part, a first signal acquisition part and an atom gas chamber filled with alkali metal atoms. Firstly, the first excitation part excites the alkali metal atoms in the atom gas chamber from a ground state to a Rydberg state; when the to-be-detected microwave enables the alkali metal atomic absorption spectrum in the Rydberg state to change, the first signal acquisition part acquires a spectral signal, and finally, the processor is used for calculating the field intensity of the to-be-detected microwave according to the spectral signal. The quantum coherence characteristic of Rydberg atoms is utilized, the advantage of measuring the field intensity of microwaves far better than that of a traditional dipole moment antenna is achieved, the measurement precision can reach the uV / cm magnitude, the SERF magnetometer system can have higher precision than a traditional magnetometer, and the fT magnitude magnetic field range is achieved. The same alkali metal atom gas chamber is utilized, pump light is added in other directions, and the advantages of an SERF magnetometer are combined, so that simultaneous measurement of a high-precision magnetic field and a microwave field is realized.

Description

technical field [0001] The invention relates to the technical field of precision measurement, in particular to a measuring device. Background technique [0002] Electromagnetic field measurement is one of the most important physical parameters in precision measurement science. Among them, the weak magnetic field measurement in the electromagnetic field measurement has important application value in the fields of resource exploration, magnetic material detection, biomedicine and aerospace. [0003] Compared with traditional Hall effect sensors and fluxgate magnetometers, SERF magnetometers have the advantages of high sensitivity, small size, and low cost. The SERF magnetometer utilizes the atomic spin in the atomic gas chamber to maintain ultra-high coherence, and has abnormal sensitivity to the magnetic field, and its accuracy of measuring the magnetic field can reach the fT level. [0004] The microwave field also belongs to the electromagnetic field. The measurement of t...

Claims

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Application Information

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IPC IPC(8): G01R29/08
CPCG01R29/0871
Inventor 石猛张文彬肖爱民董文博张建泉
Owner TECH & ENG CENT FOR SPACE UTILIZATION CHINESE ACAD OF SCI
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