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Active contour model image segmentation method based on SLIC superpixel segmentation and saliency detection algorithm

An active contour model and superpixel segmentation technology, applied in image analysis, image enhancement, image data processing, etc., can solve the problems of long processing time and insufficient accuracy, and achieve good versatility, strong anti-noise ability, and calculation results. accurate effect

Pending Publication Date: 2021-08-27
GUIZHOU POWER GRID CO LTD
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AI Technical Summary

Problems solved by technology

It can overcome the problems of too many iterations of the traditional active contour model, long processing time, and insufficient accuracy. The saliency detection algorithm based on SLIC superpixel segmentation is combined with the active contour model, and the active contour model is improved. The image segmentation accuracy and segmentation speed have been improved

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  • Active contour model image segmentation method based on SLIC superpixel segmentation and saliency detection algorithm
  • Active contour model image segmentation method based on SLIC superpixel segmentation and saliency detection algorithm
  • Active contour model image segmentation method based on SLIC superpixel segmentation and saliency detection algorithm

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Embodiment Construction

[0041] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. It should be understood that the preferred embodiments are only for illustrating the present invention, but not for limiting the protection scope of the present invention.

[0042] The present invention uses the SL1C algorithm to preprocess the image. Compared with other segmentation algorithms, the SL1C algorithm is a segmentation algorithm that is more convenient to implement. This algorithm can not only segment color images, but also applies to grayscale images. It can segment images into pixel blocks as compact as cells. It is easy to express the neighborhood characteristics of pixels, and does not need to set too many parameters, the running speed is fast, and the segmentation results can ideally maintain the outline of the target in the image. Afterwards, the contrast between irregular superpixel blocks is calculated to estimate the...

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Abstract

The invention discloses an active contour model image segmentation method based on SLIC superpixel segmentation and a saliency detection algorithm. The method comprises the following steps: firstly, preprocessing an image by using an SLIC algorithm to obtain a superpixel segmentation result; for a superpixel segmentation result, calculating the contrast between irregular superpixel blocks to estimate a saliency value so as to obtain a salient region, and then the obtained salient information and the spatial correlation between pixels being subjected to weighted fusion to obtain a saliency map; then extracting a region boundary of the saliency map by using a Canny operator, and constructing an initial level set phi by taking the saliency region boundary as an initial curve. The problems of too many parameters and the like existing in an existing active contour CV model are improved, the improved active contour CV model is used for further processing an ultraviolet image, and finally an accurate and ideal ultraviolet segmentation image is obtained.

Description

technical field [0001] The invention relates to the fields of electric equipment discharge detection and image processing, in particular to an active contour model image segmentation method based on SLIC superpixel segmentation and saliency detection algorithm. Background technique [0002] At present, ultraviolet imaging technology is an important means to detect insulation discharge outside the line. This technology can detect the ultraviolet light signal emitted by the discharge with a wavelength of 240-280nm, output the ultraviolet image of the discharge, and gradually use the number of photons as the quantification of the discharge intensity. parameter. However, due to the white noise points caused by inherent shot noise in the UV image, it will affect the evaluation of the equipment discharge state. Accordingly, how to segment the actual discharge area from the UV image and use it for the insulator discharge state Effective detection is the key to this technology. ...

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Application Information

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IPC IPC(8): G06T7/00G06T7/11G06T7/12G06T7/13G06K9/62
CPCG06T7/0002G06T7/11G06T7/12G06T7/13G06T2207/20104G06F18/23213
Inventor 陈科羽陈凤翔徐梁刚赵法姬鹏飞
Owner GUIZHOU POWER GRID CO LTD
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