Temperature influence testing device for computer mainboard

Abstract

The invention discloses a temperature influence testing device for a computer mainboard, and relates to the technical field of mainboard testing devices. The device comprises a heat preservation box, wherein a turnover hole is formed in the top of the heat preservation box, a turnover mounting plate is arranged in the turnover hole, and the two sides of the turnover mounting plate are fixedly connected with a short rotating shaft and a long rotating shaft respectively; wherein the top of the heat preservation box is fixedly connected with a short rotating cylinder and a long rotating cylinder, one end of the short rotating shaft and one end of the long rotating shaft are rotationally connected into the short rotating cylinder and the long rotating cylinder respectively, and one end of the long rotating shaft is fixedly connected with a first rotating handle. According to the invention, after the mainboard is installed, the first rotating handle can be rotated to turn the mainboard into the heat preservation box, so that continuous operation of external installation and internal testing is realized, rapid installation can be realized, internal heat preservation can be carried out during testing, and the testing accuracy is improved; besides, the situation that negative effects are generated between heat preservation work and installation work can be effectively avoided.

Description

technical field [0001] The invention relates to the technical field of main board testing devices, in particular to a temperature influence testing device for a computer main board. Background technique [0002] Computer motherboards, also known as motherboards and system boards, are divided into two types: commercial motherboards and industrial motherboards. The motherboard is installed in the chassis and is one of the most basic and important components of the computer. The main circuit system of the motherboard generally includes components such as BIOS chip, I / O control chip, key and panel control switch interface. test. [0003] When performing temperature-affected performance tests on the main board, the main board needs to be fixed and kept warm. However, in order to ensure the temperature near the main board in the existing test device, the main board needs to be installed inside the device, which makes the installation process cumbersome and inconvenient. If it is ...

AI Technical Summary

Problems solved by technology

[0003] When performing temperature-affected performance tests on the main board, the main board needs to be fixed and kept warm. However, in order to ensure the temperature near the main board, the existing test device needs to install the main board inside the device, which makes the installation process cumbersome and inconvenient. If it is installed outside the device Mainboard, it will be difficult to maintain the temperature near the mainboard, which will affect the accuracy of the test results. Therefore, in order to solve the above problems, the application proposes a temperature influence test device for computer mainboards.

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