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Etching machine structure capable of dynamically adjusting horizontal position of coil

A technology of horizontal position and dynamic adjustment, which is applied in the direction of discharge tubes, electrical components, circuits, etc., and can solve problems such as affecting yield, distortion of process parameters, and inability to effectively clean the reaction chamber.

Pending Publication Date: 2021-06-18
HERMES EPITEK
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] like figure 1 As shown, when the etching machine is used for a period of time, on the wall of the reaction chamber, there will be polymer deposition after the plasma reaction (dark area in the figure), and the deposition of related polymers will be Distortion of the process parameters in the reaction chamber. In addition, when the thickness of the polymer deposition gradually increases, the level of impurity particles in the reaction chamber will also increase, which will seriously affect the yield.
[0004] The existing inductively coupled plasma etching machine, especially when using dry clean (dry clean), because the position of the coil is fixed at the same position, so the part where the polymer is removed (the light-colored area in the figure), It is also restricted, causing the reaction chamber to not be cleaned effectively

Method used

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  • Etching machine structure capable of dynamically adjusting horizontal position of coil
  • Etching machine structure capable of dynamically adjusting horizontal position of coil
  • Etching machine structure capable of dynamically adjusting horizontal position of coil

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Embodiment Construction

[0046] like figure 2 and image 3 As shown, this embodiment is an etching machine structure 100 with dynamically adjustable coil horizontal position, which includes: a first plasma reaction chamber 10 ; a horizontal sliding module 20 ; a coil support 30 ; and a coil module 40 .

[0047] The first plasma reaction chamber 10 is, for example, a plasma reaction chamber capable of completing semiconductor or photoelectric device etching process, and the first plasma reaction chamber 10 has a first reaction chamber 110 .

[0048] The horizontal slide module 20 has: at least one first height support 211 ; a first horizontal support 212 ; a first slide 213 ; and a second slide 214 .

[0049] The first height support 211 is fixed on the first side of the first plasma reaction chamber 10, and the first height support 211 supports the coil module 40 and makes the coil module 40 span the first plasma reaction chamber 10 The height is so that the coil module 40 will not interfere with t...

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Abstract

The invention discloses an etching machine structure capable of dynamically adjusting the horizontal position of a coil. The etching machine structure comprises a first plasma reaction cavity; a horizontal sliding module having at least one first height support; a first horizontal support; a first sliding piece; and a second sliding piece; a coil holder; and a coil module, wherein the first sliding piece and the second sliding piece enable the coil module to move in the X-axis direction or the Y-axis direction above the first plasma reaction cavity. By means of the implementation of the invention, the sediments on different parts of the wall body of the reaction chamber can be dynamically cleaned.

Description

technical field [0001] The invention relates to an etching machine structure, in particular to an etching machine structure in which the horizontal position of a coil can be dynamically adjusted. Background technique [0002] For Inductively Coupled Plasma (ICP), the position and length of the coil are very important. Once the length and position of the coil are fixed, they will not change again, so the uniformity of plasma concentration, electron temperature distribution, and the position and degree of local damage in the reaction chamber will be fixed. [0003] like figure 1 As shown, when the etching machine is used for a period of time, on the wall of the reaction chamber, there will be polymer deposition after the plasma reaction (dark area in the figure), and the deposition of related polymers will be This causes distortion of the process parameters in the reaction chamber. In addition, when the thickness of the polymer deposition gradually increases, the level of im...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/32
CPCH01J37/321H01J37/32862H01J2237/334
Inventor 林志隆蔡兆哲陈俊龙
Owner HERMES EPITEK
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