Degradation modeling and life prediction method considering performance index clustering in dynamic environment
A dynamic environment and life prediction technology, applied in design optimization/simulation, character and pattern recognition, instruments, etc., can solve problems such as difficult operation, difficult Copula function, complex form of Copula function, etc.
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[0073] The present invention verifies the feasibility of the proposed model through a simulation test. The simulated object is the DT830 digital multimeter, which includes five measurement positions: DC voltage (DCV), DC current (DCA), DC resistance (DCR), AC voltage (ACV), AC current (ACA), each There are several different ranges for the measurement gears. When the measurement error of any measurement gear of the multimeter exceeds a certain range, it is considered to be invalid. Therefore, the measurement error under the highest range of the five gears is used as the five performance indicators of the multimeter for simulation. These five performance indicators are actually degraded by the degradation of two groups of key public components inside the multimeter, which are 1) voltage divider / shunt resistor; 2) integrated chip ICL7160 and LCD. The voltage divider / shunt resistance can be subdivided into two groups, one of which controls DC voltage (DCV), AC voltage (ACV) and D...
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