Test method and device, electronic equipment and computer storage medium

Abstract

The embodiment of the invention relates to the technical field of testing, and discloses a testing method and device, electronic equipment and a computer storage medium, and the testing method comprises the steps: receiving a testing request sent by a client for any micro-service, wherein the any micro-service is a real service and/or a baffle service, the real service comprises a target service node pointed by a baffle pointer in the test link and a service of a service node located before the target service node pointed by the baffle pointer, and the baffle service comprises a service of a service node located behind the target service node pointed by the baffle pointer in the test link, and the test link comprises a plurality of service nodes; and then, sending a test request to the baffle middle station, so that the baffle middle station determines to forward the test request to the real service or the baffle service according to preset parameters, asserts the test request through the real service or the baffle service, and returns a corresponding assertion result; and marking the service nodes through pointers to achieve a pluggable baffle.

Description

technical field [0001] The embodiments of the present application relate to the technical field of testing, and specifically, the present application relates to a testing method, device, electronic equipment, and computer storage medium. Background technique [0002] In the field of Internet distributed technology, the architecture model of microservices has gradually occupied the mainstream position. After the application module is split into microservices, the dependencies and collaboration network between services become intricate. How to improve the testability of microservices with external dependencies will directly affect the cycle and quality of software delivery. [0003] In the existing microservice testing technology, the way of developing interface baffle program is often used to solve the external dependency problem. For example, when testing an interface, mock testing is often used to simulate the actual working environment. Mock testing is to create a virtual...

AI Technical Summary

Problems solved by technology

[0004] However, the inventors of the present application found in the process of specific examples that the use of the baffle program itself has great limitations

First of all, the baffle program itself is not flexible enough. Each service that needs to be mocked needs to write a baffle separately, and the result returned by calling the baffle program is a static result, and it is impossible to return a specific response according to different inputs.

Second, when the interface of the microservice under test changes, the bezel program needs to be modified and upgraded in a targeted manner. In the early stage of development, the frequency of interface changes is very high

Third, the baffle program needs to be deployed separately and takes up hardware resources

Fourth, the implantation of the baffle may require modifying the calling address in the code configuration file. If there is intrusion into the service code, the removal of the baffle also needs to be removed manually.

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