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Method and system for testing USB electronic disks in batches

A technology of batch testing and electronic disk, which is applied in static memory, instruments, etc., can solve the problems of long time consumption and low efficiency

Active Publication Date: 2021-04-09
AXD (ANXINDA) MEMORY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the existing test methods for USB DOM electronic disks are inefficient and time-consuming

Method used

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  • Method and system for testing USB electronic disks in batches
  • Method and system for testing USB electronic disks in batches
  • Method and system for testing USB electronic disks in batches

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Embodiment Construction

[0051] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with aspects of the present application as recited in the appended claims.

[0052] See first figure 1 , is a schematic diagram of a method for batch testing USB electronic disks according to the present disclosure, the method can be applied to computer equipment, and the computer equipment communicates with the flight control of the drone. Further, the method may include the content described in the following steps S11-S13.

[0053] Step S11, when detecting th...

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Abstract

The invention discloses a method and a system for testing USB electronic disks in batches. According to the invention, batch testing of a plurality of to-be-tested USB electronic disks can be realized, read-write testing can be carried out on the plurality of to-be-tested USB electronic disks through the target testing program to obtain the read-write testing result corresponding to each to-be-tested USB electronic disk, and then each read-write testing result is identified, and when the read-write test result represents that the first USB electronic disk corresponding to the read-write test result passes the test, a first visualization result corresponding to the first USB electronic disk is output, and when the read-write test result represents that the second USB electronic disk corresponding to the read-write test result does not pass the test, a second visualization result corresponding to the second USB electronic disk is output. Through the design, batch automatic testing of the USB electronic disks to be tested can be realized, the batch testing efficiency of the USB electronic disks is further improved, the testing time consumption is reduced, and the labor cost and the time cost consumed by testing are further reduced.

Description

technical field [0001] The present disclosure relates to the technical field of USB DOM electronic disk testing, in particular to a method and system for batch testing USB electronic disks. Background technique [0002] In the storage industry, the quality of storage devices is of great concern to customers. In the prior art, one computer can only test one USB DOM electronic disk by using the H2test software to test the hard disk, which cannot meet the needs of mass production. In the existing technology, the H2test software cannot realize simultaneous testing of multiple USB DOM electronic disks; when using the H2test software to test the hard disk, it is necessary to manually select the test target, and then click to start, which cannot realize automation and one-key operation To improve production efficiency, one computer tests one disk and one window is displayed on the desktop, which appears to be very inefficient in the mass production process, which increases labor c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 李修录尹善腾朱小聪吴健全
Owner AXD (ANXINDA) MEMORY TECH CO LTD
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