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Loudspeaker t/s parameter measurement method, measurement device and electronic equipment

A parameter measurement and loudspeaker technology, applied in the field of acoustics, can solve problems such as inaccurate measurement, and achieve the effects of less time spent on measurement, faster research and development, and improved research and development quality

Active Publication Date: 2022-07-08
西安讯飞超脑信息科技有限公司
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Problems solved by technology

[0004] The invention provides a T / S parameter measurement method, measurement device and electronic equipment of a loudspeaker, which are used to solve the defect of inaccurate measurement in the prior art and realize efficient and high-quality detection

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  • Loudspeaker t/s parameter measurement method, measurement device and electronic equipment
  • Loudspeaker t/s parameter measurement method, measurement device and electronic equipment

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Embodiment Construction

[0046] In order to make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions in the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention. , not all examples. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0047] The Thiele-Small parameter (abbreviated as T / S parameter) is the basic parameter of the speaker system mathematical model proposed by A.N.Thiele and R.H.Small, which is adopted by the AES2-1984 (r2003) standard. While most of the useful loudspeaker parameters had been defined by other researchers before A.N. Thiele and R.H. Small, Thiele and Small designed these and a few new parameters as a whole and was ea...

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Abstract

The invention provides a T / S parameter measurement method, a measurement device and electronic equipment of a loudspeaker. The T / S parameter measurement method of a loudspeaker includes: acquiring a first impedance curve of the loudspeaker when the diaphragm is loaded and a second impedance curve when the diaphragm is unloaded. Impedance curve; obtain the structure of the equivalent circuit of the speaker, and determine the equivalent impedance of the equivalent circuit; determine the initial value of the equivalent parameters of the equivalent circuit based on the first impedance curve and the second impedance curve; The objective is to minimize the difference between the effective impedance and the measured impedance read from the second impedance curve, and the equivalent parameters are adjusted to obtain the measurement result. The method for measuring the T / S parameter of the loudspeaker of the present invention, by establishing an equivalent impedance function, and taking the parameters measured from the impedance curve as the initial value for gradual optimization, in the case of collecting fewer frequency points, an accurate measurement can be obtained. The measurement results, and the measurement time is less, which helps to improve the research and development quality of earphones and speed up the research and development.

Description

technical field [0001] The present invention relates to the technical field of acoustics, in particular to a method for measuring T / S parameters of a loudspeaker, a measuring device and electronic equipment. Background technique [0002] Loudspeakers are widely used in electronic equipment such as headphones. When designing loudspeakers, it is necessary to measure their parameters to facilitate the design of subsequent structures. Among them, the T / S parameters are the most widely used and recognized group of parameters in the electro-acoustic industry. [0003] In the prior art, when measuring T / S parameters, it is usually a point-by-point frequency sweep of a limited number of frequency points on the impedance curve to read the center frequency, peak value and bandwidth for subsequent calculation. Rarely, making the measurement inaccurate. In order to improve the accuracy, in the related art, multiple sets of curves are measured, the average value is taken, or a user-def...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04R29/00
CPCH04R29/001H04R29/003
Inventor 马进付中华王海坤
Owner 西安讯飞超脑信息科技有限公司
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