Triggering method based on oscilloscope measurement parameters
A technology for measuring parameters and oscilloscopes, applied in measuring devices, measuring electrical variables, instruments, etc., can solve the problems that the description of waveform characteristics is not intuitive and accurate, and the extraction of target waveforms is not accurate enough.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0045] figure 1 It is a specific implementation flow chart of the trigger method based on the oscilloscope measurement parameters of the present invention. Such as figure 1 As shown, the present invention is based on the concrete steps of the trigger method of oscilloscope measurement parameter comprising:
[0046] S101: Signal sampling:
[0047] The ADC module in the oscilloscope collects the input analog signal to obtain ADC sampling data.
[0048] S102: level comparison:
[0049] Set the high level value V according to the actual situation H and a low level value of V L , Compare the ADC sampling data with the high and low level values to determine the rising and falling edges of the input analog signal. figure 2 It is a schematic diagram of determining the rising and falling edges according to the high and low level values.
[0050] S103: Select the trigger mode:
[0051] According to the actual needs, select a trigger method among the alternative trigger method...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com