Hardware module testing method and system, electronic equipment and storage medium

Abstract

The embodiment of the invention relates to the technical field of communication, and discloses a hardware module testing method and system, electronic equipment and a storage medium. The hardware module test method comprises the steps of obtaining pin information of a to-be-tested hardware module; acquiring information of a micro control unit (MCU) for testing the hardware module to be tested, wherein the information of the MCU at least comprises pin information of the MCU; obtaining a test configuration file according to the pin information of the hardware module to be tested and the pin information of the MCU; and obtaining a test result of the to-be-tested hardware module according to the test configuration file. According to the hardware module test method provided by the embodiment ofthe invention, complex instruments and meters are not needed, the test cost can be reduced, the test process of the hardware module is flexibly configured, and the operability and expandability of the test process are greatly improved.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of communication, and in particular to a hardware module testing method, system, electronic equipment and storage medium. Background technique [0002] With the rapid development of semiconductor technology, hardware modules with single function and huge volume have completed the transformation to highly integrated ones with high performance, high density, small volume and multiple functions. The technological development and product production of all walks of life are inseparable from various hardware modules. Since the hardware modules have been highly integrated, the internal structure of the hardware modules is becoming more and more sophisticated and complex. Any small differences in the hardware modules will affect the Performance and functionality of hardware modules. In order to ensure the performance of the hardware module, the hardware module needs to undergo multiple pin...

AI Technical Summary

Problems solved by technology

The relevant hardware module test method is simply to manually judge the performance of the instrumentation (such as readings or waveforms, etc.) to realize the functional test of the hardware module. The cost of using instruments is relatively high, and different functional tests need to be performed Manual replacement of instruments and meters occupies a large number of pin resources of hardware modules, resulting in inflexible and incomplete testing process, low operability and low scalability

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