An airborne interferometric synthetic aperture radar complex scene elevation inversion method and system
An interferometric synthetic aperture and complex scene technology, applied in the field of airborne interferometric synthetic aperture radar complex scene elevation inversion, can solve the problems of lack of elevation data, low elevation accuracy in low coherence areas, and difficult interferometric processing steps, so as to improve the elevation accuracy. , Improve the accuracy of elevation inversion and meet the needs of high-precision geographic surveying and mapping
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0031] The principles and features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.
[0032] Such as Figure 1-Figure 11 as shown, figure 1 One of the schematic flow charts provided for the embodiment of the complex scene elevation inversion method of the present invention; figure 2 The overall schematic diagram provided for other embodiments of the complex scene elevation inversion method of the present invention, wherein SLC represents a single-view complex image pair, and SLC1 and SLC2 are single-view complex images acquired for the first flight to form a single-view complex image pair, SLC3 and SLC4 are single-view complex images acquired in the second flight, forming a single-view complex image pair, and DSM stands for digital surface model; image 3 Schematic diagram of the data fusion metho...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com