Test question analysis information generation method and system supporting self-examination paper marking

A technology of information generation and test questions, which is applied in the computer field, can solve the problems of huge amount of information in search results and large differences in test question analysis information search

Pending Publication Date: 2020-11-10
广州云蝶科技有限公司
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Problems solved by technology

[0005] The purpose of the embodiments of the present invention is to provide a test question analysis information generation method and system that supports self-grading, so as to solve the existing problems of large differences in search for test question analysis information and huge amount of information in search results

Method used

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  • Test question analysis information generation method and system supporting self-examination paper marking
  • Test question analysis information generation method and system supporting self-examination paper marking
  • Test question analysis information generation method and system supporting self-examination paper marking

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Embodiment Construction

[0037] The technical solutions of the present invention will be described in further detail below with reference to the accompanying drawings and embodiments.

[0038] figure 1 It is a flow chart of the method for generating test question analysis information supporting self-marking provided by the embodiment of the present invention. The subject of execution of the method may be a terminal, a test question analysis information generating system supporting self-grading, and the like. Such as figure 1 As shown, the method includes the following steps:

[0039] Step 110, identify the test question information.

[0040] Wherein, the picture of the test paper containing the test question information can be obtained from the database, or the picture containing the test question information can be taken through the terminal. When the latter method is selected, an app that captures test question information can be installed on the terminal, and a picture containing test question ...

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Abstract

The invention provides a test question analysis information generation method supporting self-examination paper marking. The test question analysis information generation method comprises the steps ofidentifying test question information; according to an identification result, obtaining storage information of test question analysis information corresponding to the test question information; and according to the storage information, generating a two-dimensional code corresponding to the test question analysis information, so that the search difficulty of the test question analysis informationis reduced, and self-marking can be realized by scanning the two-dimensional code.

Description

technical field [0001] The invention relates to the field of computer technology, in particular to a method and system for generating analysis information of test questions supporting self-marking. Background technique [0002] The traditional way of marking papers is all manual, which is time-consuming, labor-intensive and inefficient. In order to improve the efficiency of marking papers, machine-readable cards are widely used to read answer sheets. In this way, students first use 2B pencils to fill in the answers to the questions on the corresponding positions on the answer sheet. After the answer sheet is converted into an electronic image by a high-speed scanner, Use machines to automatically judge whether each objective question is correct or not. The method of reading the answer sheet by the machine has the following disadvantages: it can only read the objective questions, but cannot analyze the subjective questions. [0003] With the development of information techn...

Claims

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Application Information

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IPC IPC(8): G06T7/13G06T5/00G06K17/00G06Q50/20
CPCG06T7/13G06K17/0025G06Q50/205G06T2207/30176G06T5/90
Inventor 田雪松
Owner 广州云蝶科技有限公司
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