Method for detecting whether test bit and test machine interface are wrongly connected and chip test system

Abstract

The invention discloses a method for detecting whether a test position of a chip test board is wrongly connected with a test machine interface or not and a chip test system, and is suitable for the situation that the chip test board is provided with a plurality of chip test positions, and each chip test position is connected with a corresponding interface of a test machine through a connector in awiring manner to achieve connection between a chip and the test machine. The method specifically comprises the following steps of: respectively connecting a connector on each chip test position withresistors with different resistance values in series, outputting an excitation signal to each resistor by a test machine, and acquiring a response signal of each resistor; and finally, judging whetherthe connector of each chip test position is wrongly connected with each interface of the test machine or not according to whether the response signal of each resistor conforms to the corresponding preset signal or not. Therefore, the situation that the testing machine mixes the testing results of the chips of all the chip testing positions due to the fact that the connectors of the chip testing positions are connected with the testing machine interface by mistake can be avoided, and then discharging and mixing are avoided.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a method for detecting whether a test bit of a chip testing board and a testing machine interface are wrongly connected, and a chip testing system. Background technique [0002] In order to ensure the quality of the chip, chip performance testing is required before the chip leaves the factory. Only chips that meet the performance requirements will be packaged and shipped. A chip testing system usually includes a testing machine loaded with a testing program, a test circuit board communicated with the testing machine, and a handling device. The handling device unloads the tested chip to a corresponding position according to the test results output by the testing machine. [0003] In order to improve the test efficiency, a plurality of test positions are usually arranged on the test circuit board, and each test position realizes the electrical connection between the chip under...

AI Technical Summary

Problems solved by technology

However, when artificially wiring the connectors of each test position on the test circuit board with the interface of the tester, it is easy to mix the connectors with the interfaces of the tester. If the wiring is mixed, the chip test results will be confused. , when the handling device unloads materials according to the test results, it will also make mistakes

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