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Method and device for detecting wire ingots and wire ingot sorting system

A silk spindle and target detection technology, which is applied in the silk spindle sorting system and the detection of silk spindles, can solve the problems of missed detection, low detection efficiency, false detection, etc.

Pending Publication Date: 2020-10-23
ゼジャンハーレイテクノロジーカンパニーリミテッド
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention provides a method and device for detecting silk ingots and a sorting system for silk ingots, which are used to solve the problems of missed detection and false detection in the existing methods for detecting surface defects of silk ingots, as well as the problems of high detection cost and low detection efficiency. question

Method used

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  • Method and device for detecting wire ingots and wire ingot sorting system
  • Method and device for detecting wire ingots and wire ingot sorting system
  • Method and device for detecting wire ingots and wire ingot sorting system

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Embodiment 1

[0101] The embodiment of the present invention provides a method for detecting silk ingots, which is applied to the online detection scene of silk ingots on production lines, such as figure 1 As shown, the method includes:

[0102] Step S101: Obtain an image of the to-be-detected silk spindle, and input it into the target detection model using the improved YOLO network based on depth separable convolution and dot convolution to detect defective areas and / or interference areas;

[0103] In the embodiment of the present invention, when acquiring the image of the silk spindle to be inspected, the image of the silk spindle on the production line can be synchronously acquired online, so that the silk spindle on the production line can be detected online, or the pre-collected silk spindle image can be obtained asynchronously. Detection.

[0104] After acquiring the image of the filament to be detected, input the image of the filament into the target detection model of the YOLO network impr...

Embodiment 2

[0167] The method for detecting silk ingots in the present invention is described above, and the device for detecting silk ingots that performs the above method is described below.

[0168] See image 3 , The embodiment of the present invention provides a device for detecting silk spindles, including:

[0169] The target detection module 301 is used to obtain the image of the silk spindle to be detected, and input it into the target detection model of the YOLO network improved based on depth separable convolution and dot convolution to detect the defect area and / or the interference area;

[0170] The data extraction module 302 is configured to extract designated reference data of the defect area and / or the interference area when the defect area and / or the interference area are detected;

[0171] The defect judgment module 303, according to the designated reference data and preset standard reference data corresponding to the defect sample area, determines whether the silk spindle in the...

Embodiment 3

[0193] See Figure 4 , Another embodiment of the device for detecting silk in the embodiment of the present application includes:

[0194] Processor 401, memory 402, transceiver 409 and bus system 411;

[0195] The memory is used to store programs;

[0196] The processor is used to execute the program in the memory and includes the following steps:

[0197] Obtain the image of the to-be-detected silk ingot and input it into the target detection model of the YOLO network improved based on depth separable convolution and dot convolution to detect the defect area and / or the interference area;

[0198] When it is determined that the defect area and / or the interference area is detected, extract the designated reference data of the defect area and / or the interference area;

[0199] Determine whether the silk spindle in the silk spindle image is a defective product according to the designated reference data and the preset standard reference data corresponding to the defect sample area;

[0200] ...

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Abstract

The invention provides a method and device for detecting a filament ingot and a filament ingot sorting system. The method comprises the steps: obtaining a to-be-detected filament ingot image, inputting the to-be-detected filament ingot image into a target detection model employing an improved YOLO network based on depth separable convolution and point convolution, and carrying out the detection ofa defect region and / or an interferent region; when it is determined that the defect area and / or the interferent area are / is detected, specified reference data of the defect area and / or the interferent area are / is extracted; determining whether the filament ingot in the filament ingot image is a defective product or not according to the specified reference data and preset standard reference data corresponding to the defect sample area; and when it is determined that the defective products are defective products, the defective products are sorted to a defective product area, defect informationof the defective products is output and displayed, and the defect information comprises position information of the defective area. According to the method and device for detecting the wire ingot andthe wire ingot sorting system, the problems of missing detection and false detection existing in an existing method for detecting the surface defects of the wire ingot are solved, and the problems that the detection cost is high and the detection efficiency is low are solved.

Description

Technical field [0001] The invention relates to the technical field of silk ingot detection, in particular to a method, a device and a silk ingot sorting system for detecting silk ingots. Background technique [0002] In the production process of industrial raw silk, the production quality of the silk spindle directly affects the production efficiency and production efficiency of the producer. At present, in the production process of silk ingots, it usually requires a lot of manpower and material resources to inspect the quality of the surface of the silk ingots to improve the production quality of the silk ingot products. [0003] The grease defect on the surface of the spindle is one of the many defects on the surface of the spindle, most of which are mechanical grease and man-made dirt during the handling process. The greasy dirt caused by the surface of the spindle directly affects the appearance of the spindle and the dyeing of the original yarn after unwinding, which directl...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/62G06K9/32G06K9/62G06N3/04
CPCG06T7/0004G06T7/62G06V10/25G06N3/045G06F18/214
Inventor 崔浩黄虎周璐
Owner ゼジャンハーレイテクノロジーカンパニーリミテッド
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