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Project test defect analysis method, device, equipment and storage medium

A defect analysis and project technology, applied in the field of testing, can solve problems such as manpower consumption and inaccurate analysis results, and achieve the effects of saving labor costs, improving data processing efficiency, and optimizing items to be tested

Pending Publication Date: 2020-09-01
ONE CONNECT SMART TECH CO LTD SHENZHEN
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  • Abstract
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Problems solved by technology

[0004] The embodiment of the present invention provides a project test defect analysis method, device, equipment, and storage medium to solve the problem of manual calculation and analysis of defect data in the prior art, resulting in labor-intensive and inaccurate analysis results

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  • Project test defect analysis method, device, equipment and storage medium
  • Project test defect analysis method, device, equipment and storage medium
  • Project test defect analysis method, device, equipment and storage medium

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Embodiment Construction

[0027] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0028] The project test defect analysis method provided by the present invention can be applied in such as figure 1 An application environment in which a client communicates with a server over a network. Among them, clients include but are not limited to various personal computers, notebook computers, smart phones, tablet computers, cameras and portable wearable devices. The server can be implemented by an independent server or a server cluster compos...

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Abstract

The invention discloses a project test defect analysis method, device and equipment and a storage medium. The method comprises the steps of receiving a project test request sent by a client, and analyzing a to-be-tested project and an interface call parameter contained in the project test request; calling a preset interface configured in a preset defect tracking tool according to the interface calling parameter, and obtaining all defect data of the to-be-tested project in the testing process through the preset interface; inputting all defect data into a preset defect analysis model, and receiving a defect analysis result output by the defect analysis model; and associatively storing the to-be-tested project and the defect analysis result in a database, and sending the defect analysis result to the client. According to the invention, the labor cost is saved, the defect data granularity is finer, and the data processing efficiency and the reliability of the defect analysis result are improved.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method, device, equipment and storage medium for analyzing project testing defects. Background technique [0002] With the rapid development of computer science and technology, the application of software is gradually promoted, the scale and cost of software are gradually increasing, the complexity of software design is increasing, and there are more and more opportunities for errors or defects in software development. Awareness of the importance of software quality is growing. Software process management is the key to improving software quality and software development efficiency, and software defect management is an important aspect of software process management. An important means of software quality. [0003] At present, key indicators for measuring software development quality often require manual observation of defect data and manual calculation of defect data, which c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3688
Inventor 范永骏
Owner ONE CONNECT SMART TECH CO LTD SHENZHEN
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