Method and device for measuring machine loss value
A measurement method and technology of loss value, applied in the direction of measuring devices, measuring electrical variables, and measuring dielectric properties, etc., can solve problems such as low efficiency, high cost of measuring instruments, and complicated measurement operations
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0060] Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the present disclosure. Rather, they are merely examples of apparatuses and methods consistent with aspects of the present disclosure as recited in the appended claims.
[0061]In order to solve the technical problems in the related technologies, the embodiment of the present disclosure provides a measurement method, the method includes: obtaining the reference loss value of the machine; using the reference loss value to calibrate a preset number of motherboards respectively, and obtaining the preset indicators of each motherboard When the calibration v...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com