Analog circuit fault positioning and fault element parameter identification method

Abstract

The invention discloses an analog circuit fault positioning and fault element parameter identification method. The method comprises the steps of acquiring a transmission function of a measuring point;analyzing fuzzy group information of the analog circuit; determining a representative fault element of each fuzzy group; obtaining a feature matrix of each representative fault element based on the transfer function; constructing an overdetermined equation set of polynomial fitting, calculating to obtain a coefficient vector corresponding to each representative fault element; when the analog circuit has a fault, carrying out state monitoring on the measurement point, carrying out fault positioning based on monitoring data, and then carrying out fault element parameter identification by utilizing a genetic algorithm for the positioned fault. By the adoption of the method, fault diagnosis and fault element parameter identification of the analog circuit can be effectively achieved. The method has the two advantages of rapid positioning of simulation before measurement and accurate parameter identification of simulation after measurement at the same time, and all parameter drift faults donot need to be stored in advance.

Description

Technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically, relates to a method for analog circuit fault location and fault component parameter identification. Background technique [0002] With the rapid development of integrated circuits, in order to improve product performance, reduce chip area and cost, it is necessary to integrate digital and analog components on the same chip. According to reports, although the analog part only accounts for 5% of the chip area, its fault diagnosis cost accounts for 95% of the total diagnosis cost. Analog circuit fault diagnosis has always been a "bottleneck" problem in the integrated circuit industry. At this stage, some developed analog circuit fault diagnosis theories have been applied in practice, such as the fault dictionary method in the simulation diagnosis method before test, the component parameter identification method and the fault verification method in the simulat...

AI Technical Summary

Problems solved by technology

However, the fault dictionary method can only deal with discrete parameter faults and hard faults, and cannot exhaust all continuous parameter faults and parameter combinations of analog components, so it can hardly be used for parametric fault diagnosis

The post-test simulation method has disadvantages such as blindness and long simulation time

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